Method for testing grounding state short circuit

Abstract

The invention belongs to the technical field of test and measurement, and relates to a method for testing a grounding state short circuit. The method comprises: step 1, disconnecting a primary power positive wire from a shell of test equipment, a primary power ground wire and a secondary power ground wire; connecting a 220V AC ground wire to a ground wire of a tested product; disconnecting a shellof the tested product, the primary power ground wire and the secondary power ground wire from the 220V AC ground wire; step 2, adding, by the test equipment, a primary power signal to the ground wire5 of the tested product; and step 3, acquiring, by an AD or a DI of the test equipment, signals of all wires except the ground wire of the tested product to judge the integrity of the ground wire ofthe tested product. By changing manual test into automatic test, the method greatly reduces the test time and the workload, shortens the test time, improves the test efficiency, the test accuracy andthe product fault location means, and completes the internal grounding state short circuit of the product more safely and reliably.

Description

technical field [0001] The invention belongs to the technical field of testing and measurement, and relates to a testing method for a grounded short circuit. Background technique [0002] The traditional test method of short circuit in ground state is mainly completed by using digital megger and other facilities. This test method has the following shortcomings: [0003] 1) Manual operation, easily affected by human factors, resulting in wrong test results; [0004] 2) The operation process is cumbersome, if there are many lines, the test workload is large; [0005] 3) The test time is long and the test efficiency is low; [0006] 4) The test accuracy is difficult to guarantee; [0007] 5) It is difficult to locate the fault of the tested product. Invention content: [0008] Aiming at the above-mentioned prior art, the present invention designs and provides a test method for short-circuiting the grounding state inside the product, the purpose of which is to change the ...

AI Technical Summary

Problems solved by technology

[0003] 1) Manual operation is easily affected by human factors, resulting in wrong test results;

[0004] 2) The operation process is cumbersome. If there are many lines, the test workload will be large;

[0005] 3) The test time is longer and the test efficiency is lower;

[0006] 4) The test accuracy is difficult to guarantee;

[0007] 5) It is difficult to locate the fault of the tested product

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