Millimeter wave detection method and millimeter wave detection device

A detection device and detection method technology, which is applied in the field of millimeter wave and terahertz coherent detection, can solve the problem that the phase information cannot be obtained by the EIT-AT split microwave detection method, and achieve the effect of small probability, easy implementation, and narrow natural width

Active Publication Date: 2019-01-08
清远市天之衡量子科技有限公司
View PDF10 Cites 16 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] The current experimental measurement and theoretical analysis show that the phase information cannot be obtained by the EIT-AT split microwave detection method based on the atomic system; at the same time, the width of the optically transparent window is affected by the laser linewidth, transition broadening, shot noise and Rydberg atom regression. Due to the influence of coherence and other factors, it is impossible to achieve precise measurement of extremely weak microwave electric fields

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Millimeter wave detection method and millimeter wave detection device
  • Millimeter wave detection method and millimeter wave detection device
  • Millimeter wave detection method and millimeter wave detection device

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0041] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of them. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of the present invention.

[0042] It should be noted that if there is a directional indication (such as up, down, left, right, front, back...) in the embodiment of the present invention, the directional indication is only used to explain the position in a certain posture (as shown in the accompanying drawing). If the specific posture changes, the directional indication will also change accordingly.

[0043] In addition, if there are descriptions involving "first", "second" and ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention discloses a millimeter wave detection method and millimeter wave detection device, belonging to the technical field of coherent detection of millimeter wave and terahertz. The method comprises the following steps: enabling a to-be-detected microwave to irradiate on an atom sample pool, and converting millimeter wave coherence into visible light signals through six-wave mixing; measuring the visible light signals to obtain amplitude and phase of the millimeter wave, thereby realizing high-sensitivity millimeter wave coherence detection. The method and the device are based on a quantum interference principle and a Rydberg atom six-wave mixing technology, convert the millimeter wave coherence into the visible light signals in an atom air chamber, and realize high-sensitivity detection of the millimeter wave through detection of visible light; and the method can obtain the detection sensitivity approximate to single photon level, realizes millimeter wave and terahertz real-time imaging of which spatial resolution is subwavelength magnitude, and provides new technical basis for precise detection of the millimeter wave and the terahertz.

Description

technical field [0001] The invention belongs to the field of coherent detection of millimeter waves and terahertz, and in particular relates to a millimeter wave detection method and device. Background technique [0002] In 2012, the Shaffer research group of the University of Oklahoma in the United States cooperated with the Pfau research group of the University of Stuttgart in Germany for the first time to use the Rydberg atom EIT and AT (Autler-Townes) splitting to convert the measurement of the microwave electric field intensity into an optical frequency measurement. The microwave electric field measurement was carried out, and the measured minimum electric field strength was 8μVcm -1 , with a sensitivity of 30μVcm -1 Hz -1 / 2 , far superior to the traditional dipole antenna microwave electric field meter. Then in 2013, based on the original experiment, they realized the measurement of the microwave polarization direction, and the polarization measurement accuracy was ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): G01J9/00G01J9/02G01J11/00
CPCG01J9/00G01J9/02G01J11/00
Inventor 邓小霞廖开宇刘笑宏梁洁张新定颜辉
Owner 清远市天之衡量子科技有限公司
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap