Test data frame generation method and device, software test method and device

A technology for testing data and generating devices, applied in software testing/debugging, electrical digital data processing, error detection/correction, etc., can solve the problems of long testing time, high error rate, low efficiency, etc. Test environment and test steps, the effect of reducing test time and error rate

Active Publication Date: 2019-01-22
BEIJING ZHONGCHUANGWEI NANJING QUANTUM COMM TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The technical problem solved by the present invention is to provide a test data frame generation method and device, a software testing method and device, and solve the problems of long test time, high error rate and low efficiency

Method used

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  • Test data frame generation method and device, software test method and device
  • Test data frame generation method and device, software test method and device
  • Test data frame generation method and device, software test method and device

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0046] This embodiment provides a method for generating a test data frame, such as image 3 shown, including:

[0047] Step a: Analyze the manual of the system to obtain all the functions to be realized by the system. The system includes several devices, and each function of the system corresponds to the device that realizes the function. For a certain function of the system, set the device that realizes the function The device is the device under test, and the rest of the devices are test tools to obtain the interaction function scenarios between each device and other devices.

[0048] In the specific implementation, first of all, according to the requirements specification and detailed design specification of the system or product, it is necessary to analyze which functions the system mainly realizes, which devices these functions interact with, and which device will finally realize the function, and regard the device that realizes the function as the tested device. Devices...

Embodiment 2

[0054] This embodiment provides a device for generating a test data frame, such as Figure 4 shown, including:

[0055] The analysis module is used to analyze the manual of the system, obtain all the functions to be realized by the system, and correspond each function of the system to the device that realizes the function. For a certain function of the system, set the device that realizes the function as the device under test, The remaining devices are test tools to obtain the interaction function scenarios between each device and other devices;

[0056] The division module is used to obtain the normal data frame and abnormal data frame corresponding to each function according to the equivalent division of each function scene, and each data frame is a test case;

[0057] The generation module is used for encapsulating the data frame according to the communication protocol and test requirements, and generating a test data frame file.

[0058] In the specific implementation, t...

Embodiment 3

[0060] This embodiment provides a software testing method based on custom data frame communication, such as Figure 5 shown, including:

[0061] Step A: Install the software test device into the tool equipment of the system, set up the test system network, and testers input a test start command to the test device to start the test.

[0062] Step B: According to the test start instruction, open and read the pre-generated test data frame file according to the property of the device under test.

[0063] Step C: Automatically send test data frames to the corresponding devices under test according to the system function number sorting; or select the required functional test items according to the current test requirements, do not select the unnecessary functional test items, and the system according to the selected functional test items Send a test data frame to the device under test.

[0064] In specific implementation, it can be designed to automatically send data sorted by fun...

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Abstract

A test data frame generation method includes analyzing a description of a system, obtaining all the functions to be realized by the system, wherein the system comprises a plurality of devices, whereineach function of the system is corresponding to the device realizing the function, and for a certain function of the system, the device realizing the function is set as the device under test, and theother devices are used as test tools, so as to obtain the interactive functional scenarios between each device and other devices; according to the equivalence division of each function scene, obtaining the normal data frame and abnormal data frame corresponding to each function, and each data frame being a test case, according to the communication protocol and test requirements, encapsulating thedata frame and generating the test data frame file. The invention adopts the mode of separating the test data from the test device, only needs to modify the test data file during the regression testwithout modifying the test device, uses the software test device to replace all the test tools, simplifies the test environment and the test steps, reduces the test time consumption and the error rate, and improves the test efficiency.

Description

technical field [0001] The invention belongs to the technical field of software testing, in particular to a test data frame generation method and device, and a software testing method and device. Background technique [0002] In the existing technology, the functions of the system need to be realized by the cooperation of multiple devices, and the test of the data frame between the devices needs to test each device in the system that has the function of data communication control, and verify the reception by observing the response of the device under test. Whether the device under test to the data frame has a certain function. The test needs to traverse all normal data frame classes and abnormal data frame classes that the device under test can handle. Regression testing requires repeating the above tests again. The above problems lead to long testing time, high error rate and low efficiency. In order to test the processing capability of data frames in all functions of ea...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/36
CPCG06F11/3672
Inventor 陈功刘辉
Owner BEIJING ZHONGCHUANGWEI NANJING QUANTUM COMM TECH CO LTD
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