Handlers for testing electronic components

Abstract

The present invention relates to a sorter for testing electronic components capable of supporting testing of electronic components in a low temperature environment. The sorter for testing electronic components according to the present invention constitutes an environment maintaining chamber, and maintains the environment maintaining chamber in a dry state, thereby having a structure capable of local cooling. According to the present invention, there are effects that the reliability of testing electronic components can be improved, cooling efficiency can be improved, and energy can be reduced.

Description

technical field [0001] The present invention relates to a sorter for testing electronic components capable of supporting electronic components such as semiconductor elements to be tested by a tester. Background technique [0002] Electronic components such as semiconductor elements are produced in many processes depending on the situation. Even if each process is carried out under standardized conditions, the more precise the electronic components are, the more they will be affected by small changes, so it is currently impossible to produce only good products. That is, defective products cannot be avoided. Therefore, the produced electronic components are classified into good and bad after being tested by a tester, and only good products are shipped. [0003] Testing of electronic components is performed when the electronic components are electrically connected to the tester. At this time, the equipment that electrically connects the socket of the tester to the electronic...

AI Technical Summary

Problems solved by technology

This chamber method has the following disadvantages: it consumes a lot of energy to maintain the temperature inside the chamber with a large space at a low temperature, and it takes a long time for cooling the electronic components.

This plate method directly cools the electronic components through conduction, so the cooling time is short, but because of the local cooling, it has the disadvantage of being affected by the relatively high temperature surrounding air, resulting in condensation or icing

In particular, if the electronic components are pre-cooled before the electronic components are tested, condensation or icing occurs, which will lead to poor electrical contact between the electronic components and the tester during the test, and then due to condensation or freeze and may cause damage to the components that make up the sorting machine

[0008] Of course, the chamber system and the plate system can be combined, but in fact, the inside and outside of the chamber cannot be completely blocked in the path for moving the electronic components, so the energy consumption must be large, especially as the relatively humid outside air flows in. Chamber, in fact it is difficult to finally prevent the phenomenon of condensation or icing

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