Dual-redundancy general test system

Abstract

The invention discloses a dual-redundancy general test system, which comprises a basic layer, a service layer and an application layer, wherein the basic layer is arranged on front-end equipment and provides a CPCI / PXI bus specification-based hardware support for the service layer, so as to connect a tested object with rear-end equipment; the service layer is arranged on the front-end equipment and the rear-end equipment and is used for providing a service function support for the application layer based on the basic layer; and the application layer is arranged on the front-end equipment and the rear-end equipment and is used for calling the basic layer based on the service layer to realize control of the basic layer and providing an interaction function with the front-end equipment or therear-end equipment for a user. The dual-redundancy general test system is applicable to different test systems and is relatively high in generality.

Description

technical field [0001] The invention belongs to the field of automatic distributed test systems, and in particular relates to a dual redundant general test system. Background technique [0002] An automated distributed test system is generally composed of front-end and back-end equipment, among which, the front-end equipment is controlled by the back-end equipment, implements data collection and processing, and sends the collected data to the back-end in real time; the back-end equipment receives data through the network and sends control commands to the front-end Device, to control the start and stop of the collection process of the front-end device. At present, there is no unified top-level design reference or specification for this type of test system, the user application, service support, and basic hardware levels are not clear, and the functional design is not perfect. In the existing technology, the overall design of the test system is generally only aimed at complet...

AI Technical Summary

Problems solved by technology

In the existing technology, the overall design of the test system is generally only aimed at completing a single function, and the real-time performance and reliability need to be improved. Some are only for analog signal or digital signal acquisition and testing, and some are only for signal acquisition without sending incentives.

Therefore, this type of test system is difficult to adapt to a variety of test environments with large data collection, complex incentive feedback loops, and high reliability and real-time requirements.

[0003] For example: test signal recorders generally only involve signal collection and recording functions, and do not have high requirements for automatic interpretation and independent excitation; digital control systems generally focus on the generation and control of excitation signals, and generally do not do real-time collection and independent analysis of feedback information. Requirements; such systems are often designed as dedicated systems for special needs, lacking the support of top-level design specifications and reserved expansion requirements. With the update and upgrade of test requirements, it is difficult to achieve compatibility or expansion for new requirements, which is not conducive to improving the system. Versatility, real-time and reliability

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