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Device for dynamically measuring X-ray film density

A dynamic measurement and film technology, applied in measurement devices, transmittance measurement, material analysis by optical means, etc., can solve the problems of strong manual dependence and slow measurement speed, reduce manual operation, improve film evaluation speed, Simple and convenient measurement method

Inactive Publication Date: 2019-03-19
SHAANXI XIYU NON DESTRUCTIVE TESTING +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The present invention is to provide a dynamic measuring device for blackness of radiographic film to overcome the problems of strong dependence on manual work, single-point measurement and slow measurement speed of existing devices, so as to realize multi-region, high-speed, High-precision dynamic measurement

Method used

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  • Device for dynamically measuring X-ray film density
  • Device for dynamically measuring X-ray film density
  • Device for dynamically measuring X-ray film density

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Embodiment Construction

[0021] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0022] see figure 1 , in order to realize the object of the present invention, the present invention provides a kind of device for dynamic measurement of the blackness of radiographic film, described system is made up of illumination intensity acquisition assembly, data processing assembly, film sending and film output assembly;

[0023] The light intensity collection component includes light intensity sensor group 2, aperture 1, light-shielding base plate 11,...

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Abstract

The invention discloses a device for dynamically measuring X-ray film density, and belong to the field of industrial X-ray film density measurement. The device overcomes the shortcomings that a traditional density measuring device is mainly used for single-point measurement and not applicable to density detection of large-scale films, and measurement processes are complicated. Illumination is collected based on multi-sensors, an ingenious structure is designed, multi-area, high-accuracy and high-speed dynamic measurement of a film density value is achieved by an automatic nondestructive transmission principle of a belt and signal processing of high-performance chips, rapid quality judgment of the large-scale films required by industrial film review occasions can be met, so that smooth implementing of subsequent processing of the films is ensured, and film processing efficiency is improved.

Description

technical field [0001] The invention relates to the field of film blackness measurement, in particular to a device for dynamic measurement of radiographic film blackness. Background technique [0002] The radiographic negative film is a negative film formed by the principle of radiographic flaw detection, which can be used to judge the welding quality of the weld. When the ray passes through the inspected weld, due to the different absorption ability of the weld defect to the ray, the intensity of the ray at the position corresponding to the weld defect on the negative film is different, resulting in different photosensitive degrees of the negative film, and thus different transparency of the negative film. The blackness of the negative refers to the transparency of the blackening of the negative, which is approximately proportional to the mass of metallic silver or dye per unit area. If the blackness value is too large or too small, the quality of the industrial film is re...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/01G01N21/59
CPCG01N21/01G01N21/59
Inventor 杨波袁黎明贾潇张宽闫芬婷安庆黄宝洋王柄凯许红愿李小兵
Owner SHAANXI XIYU NON DESTRUCTIVE TESTING
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