New material quality testing machine

Abstract

The invention discloses a new material quality testing machine. The new material quality testing machine comprises a machine frame. An open source single chip microcomputer is mounted at the top of the machine frame. A CT scanner is mounted at the top of the inner side of the machine frame. Bending mechanisms are symmetrically mounted on the left side and the right side of the machine frame. Extending mechanisms are mounted on the lateral faces of the bending mechanisms. Clamping mechanisms are symmetrically mounted at ends of the extending mechanisms in an up and down mode. The input end of the open source single chip microcomputer is electrically connected with the output end of an external power source. The output end of the open source single chip microcomputer is electrically connected with the input end of the CT scanner. According to the new material quality testing machine, the clamping mechanisms are adopted to clamp the new material, and clamping is firm. New material fallingoff during the testing process can be avoided. Application security of the new material quality testing machine is guaranteed. Through the bending mechanisms, bending testing of the new material canbe conducted. Through the extending mechanisms, extending testing of the new material can be conducted. Testing items are various. Working performance is high. New material quality can be fully tested.

Description

technical field [0001] The invention relates to the technical field of testing machines, in particular to a new material quality testing testing machine. Background technique [0002] In the prior art: the patent of the authorized publication number CN 207300733 U discloses a new material quality inspection testing machine, its structure includes a base, a power switch, a horizontal fixed platform, a column, a slide rail, a slide bar, an induction probe, and a control panel 1. An analysis device, which is provided with an analyzer, which is connected to the control panel through a data connector, and then the data information is collected by the collector, and the data information is effectively processed by the processor, and then the garbage information is filtered out by the filter, and then cooperated with The analysis chip analyzes, summarizes, and integrates the data information, and then displays it on the control panel, so that it can quickly analyze the detection da...

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Problems solved by technology

[0002] In the prior art: the patent of the authorized publication number CN 207300733 U discloses a new material quality inspection testing machine, its structure includes a base, a power switch, a horizontal fixed platform, a column, a slide rail, a slide bar, an induction probe, and a control panel 1. An analysis device, which is provided with an analyzer, which is connected to the control panel through a data connector, and then the data information is collected by the collector, and the data information is ef

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