data-driven SPI defect type intelligent identification method on an SMT production line

A data-driven, intelligent recognition technology, applied in character and pattern recognition, instruments, calculations, etc., can solve problems such as false alarm rate, high false alarm rate, poor optimization effect, etc., to reduce parameter setting errors and improve detection efficiency Effect

Active Publication Date: 2019-04-19
GUANGDONG INTELLIGENT ROBOTICS INST
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Problems solved by technology

With the continuous innovation of science and technology and the rapid development of miniaturization of electronic products, higher requirements are placed on the automation and intelligence of Surface Mount Technology (SMT, Surface Mount Technology). Among them, the quality inspection SPI (Solder Paste Inspection) technology of solder paste printing has passed The 3D-SPI automatic detection technology detects the volume, area, height, offset and sharpening of the solder paste on the pad, and identifies the quality results according to the upper and lower limits of each detection parameter set by the quality process control. However, in the actual production process, the The upper and lower control limits of detection parameters such as volume, height, area, and position offset are set by operators based on experience. Therefore, the false alarm rate and false negative rate in

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  • data-driven SPI defect type intelligent identification method on an SMT production line
  • data-driven SPI defect type intelligent identification method on an SMT production line
  • data-driven SPI defect type intelligent identification method on an SMT production line

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Embodiment Construction

[0051] In order to further understand the features, technical means, and specific objectives and functions achieved by the present invention, the present invention will be further described in detail below in conjunction with the accompanying drawings and specific embodiments.

[0052]The single detection data record format and quality results of SPI detection on an SMT production line are shown in Table 1, and the defect categories and numbers of solder paste printing are shown in Table 2. Solder paste printing solder paste defects and defect types for more accurate automatic judgment. The quality inspection data used in this example is 18,703 pieces, including "32" pieces without solder paste and "4096" pieces of bridging defects that occur independently. The details are shown in Table 3. According to the process shown in the present invention, the 18703 is studied and model verified. The specific operation steps are as follows: Table 1 five example SPI detection records

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Abstract

The invention discloses a data-driven SPI defect type intelligent identification method on an SMT production line. The method comprises the following steps of in a first stage, carrying out clusteringprocessing on SPI historical quality detection data sets, independently sampling the obtained K types of training data sets for 20 times by adopting a Bagging algorithm, and respectively training independent defect classifiers for K types of K * 20 groups of training sets by utilizing a BP neural network model to obtain K * 20 independent defect classifiers to form a classifier set; in A second stage, detecting 6 solder paste printing quality parameters online; comparing with a historical training data set to classify the detection records T; determining which category of the real-time detection point belongs to the K categories of training data sets, and when T is just located on the boundary of two or more categories of training data sets, simultaneously selecting twenty independent defect classifiers from the multiple categories of K categories of training data sets according to approximately equal quantity to carry out category judgment of detection records T; And inputting T intoeach independent defect classifier, carrying out integrated prediction on an output result according to an integration rule, and judging a defect type. According to the invention, the effect of people in automatic detection is reduced, and the online real-time detection efficiency and accuracy are improved.

Description

technical field [0001] The invention relates to the field of online detection and prediction of production and processing quality, and specifically relates to a data-driven intelligent identification method for SPI defect categories on an SMT production line. Background technique [0002] In intelligent manufacturing, online quality detection and prediction technology is one of the key technologies to improve quality management capabilities and build intelligent production lines. The application of online quality automatic detection and prediction reduces manual detection operations, improves the consistency and stability of quality detection results, detection speed and accuracy of detection results, and avoids the time and cost caused by false positives and missed quality problems to a certain extent. cost loss. With the continuous innovation of science and technology and the rapid development of miniaturization of electronic products, higher requirements are placed on th...

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Application Information

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IPC IPC(8): G06K9/62
CPCG06F18/23213G06F18/24G06F18/214Y02P90/30
Inventor 朱海平孙志娟李晓涛何非关辉扆书樵李朝晖金炯华吴淑敏倪明堂张卫平黄培
Owner GUANGDONG INTELLIGENT ROBOTICS INST
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