SPI verification method based on UVM verification methodology

A verification methodology and verification method technology, applied in the field of SPI verification based on UVM verification

Inactive Publication Date: 2019-05-10
UNIV OF ELECTRONICS SCI & TECH OF CHINA
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

In order to meet the requirements of the diversity of peripherals, the SPI bus interface has a variety of configuration methods and working modes. Ea...

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  • SPI verification method based on UVM verification methodology
  • SPI verification method based on UVM verification methodology
  • SPI verification method based on UVM verification methodology

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Embodiment Construction

[0028] The architecture of the verification platform of the present invention is as follows: figure 1 As shown, the entire verification platform mainly includes the following parts: APB bus system apb_env, SPI bus system spi_env, SPI register model spi_reg_mdl, scoreboard scoreboard, both APB and SPI systems contain a configuration component and a proxy component, and the proxy component consists of It consists of stimulus generator, driver, collector, and monitor. The above are the main components of the verification platform. In addition to instantiating the above components in the TEST layer, a sequence is also added.

[0029] The sequences in the test cases are all scheduled in the virtual sequence through the `uvm_do_on() task, and vsqr sends the data packets generated by each sequence to the specified sequencer. According to the requirements of each test, build a different virtual sequence and add it to vseq_lib. The raise_objection and drop_objection of main_phase are e...

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Abstract

The invention relates to an SPI verification method based on UVM verification methodology, which is characterized in that a verification platform is constructed by adopting the UVM verification methodology and a system-level hardware description language, and function verification is implemented on an SPI module. The verification platform comprises: a verification platform, a test case test, a virtual excitation generation module vsqr, the APB system environment is apb _ env; the APB configures a module apb _ master _ cfg, and the module apb _ master _ cfg is connected with the APB; the APB agent module is an apb _ master _ agt, and the APB agent module is an apb _ master _ agt; the SPI environment is spi _ env; the SPI configures a module spi _ cfg; the SPI agent module is set as spi _ agt; an SPI register model spi _ reg _ mdl, the system comprises a format conversion module, an excitation generation module, an excitation driver module, a response collection module, a monitoring module, and a result comparison module. The format conversion module comprises an adder, an excitation generation module, an excitation driver module, a response collection module, a monitoring module anda result comparison module. According to the invention, a UVM verification methodology is adopted to realize high hierarchy; a verification platform with high reusability can generate various types of randomized data packets under the constraint condition, traversal of all addresses and instructions is achieved, the self-checking functions of automatic report collection, result comparison and thelike with the function coverage rate are achieved, and the verification efficiency and the verification reliability are improved.

Description

technical field [0001] The invention relates to the field of functional verification and verification methodology of digital chips, in particular to a SPI verification method based on UVM verification methodology, through the construction of a verification platform, the generation of randomized incentives, the collection of function coverage, and the automatic response of response results. Check and other operations to complete the functional verification of the SPI. Background technique [0002] In recent years, with the continuous improvement of chip integration, the functional complexity of the chip has also greatly increased. The design process of the chip is more likely to introduce errors, and the verification work has become more difficult. In integrated circuit design, verification work accounts for more than half of the entire design cycle. The functional error caused by insufficient verification is the main reason for the low success rate of the first chip release...

Claims

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Application Information

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IPC IPC(8): G06F11/22G06F11/26
Inventor 李世超王忆文李辉邓强徐波赵衡
Owner UNIV OF ELECTRONICS SCI & TECH OF CHINA
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