Image analysis system and method for projection grating modeling
A technology for analyzing systems and images. It is used in 3D modeling, image enhancement, and image data processing. It can solve the problems of image distortion and low model accuracy, and achieve the effect of model fidelity and high accuracy.
Active Publication Date: 2019-05-17
UNRE SHANGHAI INFORMATION TECH CO LTD
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Problems solved by technology
[0005] The technical problem to be solved by the present invention is to overcome the defects of serious image distortion and low accuracy of model establishment in the three-dimensional reconstruction of grating projection in the prior art, and provide a combination of camera and projector capable of obtaining a projected grating modeling system. The image relationship between them is convenient to obtain overexposed and dark areas, so that the accuracy of projected grating modeling is higher, and the established model is more fidelity. Image analysis system and method for projected grating modeling
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Embodiment 1
[0041] see Figure 1 to Figure 3 , the present embodiment provides an image analysis system for projection grating modeling, the image analysis system includes an image acquisition device 11 , a projector 12 , a projection screen 13 and a processor.
[0042] The processor is respectively connected to the image acquisition device and the projector, and the processor sends trigger signals to the image acquisition device and the projector respectively.
[0043] The image acquisition device includes a camera lens, the projector includes a projection lens, and the shooting direction of the camera lens and the projection direction of the projection lens are both aligned with the projection screen;
[0044] When the projector is working, the projection screen includes a star diagram;
[0045] The image acquisition device is used to transmit image signals to the processor. In this embodiment, the image collection device collects the star diagram and transmits an image signal of the ...
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The invention discloses an image analysis system and method for projection grating modeling. The image analysis system comprises an image acquisition device, a projector, a projection screen and a processor, When the projector works, the projector is used for projecting a star map to the projection screen; The image acquisition device is used for acquiring an image of the star map and transmittingan image signal to the processor; The processor is used for analyzing the image signal and acquiring gray scale data of a target area in the image signal; The processor is also used for comparing thegray scale data with gray scale information on the star map to obtain exposure information of the image acquisition device in a target area; And adjusting the imaging information of the image acquisition device according to the exposure information. According to the image analysis system for projection grating modeling, the image relation between the camera and the projector of the projection grating modeling system can be obtained, an overexposure and darkness area can be conveniently obtained, the precision of projection grating modeling is higher, and an established model is more fidelity.
Description
technical field [0001] The invention relates to an image analysis system and method for projection grating modeling. Background technique [0002] Three-dimensional reconstruction refers to the establishment of a mathematical model suitable for computer representation and processing of three-dimensional objects. It is the basis for processing, operating and analyzing its properties in a computer environment, and it is also a key technology for establishing a virtual reality that expresses the objective world in a computer. [0003] Three-dimensional reconstruction by grating projection is a three-dimensional reconstruction method. The grating is projected onto the reference plane and the surface of the measured object respectively. Since the reference plane is a horizontal plane, the reference grating projected on it will not be deformed; when the grating is projected onto the measured object When measuring the surface of an object, the grating will have different degrees of...
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Inventor 袁丹寿孙燕生黄沛杰
Owner UNRE SHANGHAI INFORMATION TECH CO LTD