Glass substrate retest and reconditioning system and method

Abstract

A glass substrate retest and reconditioning system and method are provided, wherein the glass substrate retest and reconditioning system comprises an electrical test station, a laser repair machine, alaser long line machine, a branch retest station and a retest electrical test station. The electrical test station tests whether panels of a glass substrate have defects. The laser repair machine marks abnormality levels for the panels having the defects and diverts other glass substrates with the abnormality levels. The laser long line machine repairs the panels with the abnormality levels. Thebranch retest station divides the normal and abnormal glass substrates. The retest electrical test station recognizes the abnormal glass substrates. When the panels have the abnormality levels, the panels with the abnormality levels are retested; the panels are diverted to the laser repair machine or the laser long line machine for reconditioning according to defect types; therefore, the loss in productivity and in time cost due to retesting and reconditioning is reduced.

Description

technical field [0001] The invention relates to the field of display technology, in particular to a glass substrate retesting and repairing system and method thereof. Background technique [0002] As the demand for large-sized panels is increasing day by day, the newer generation of factories requires larger glass substrates. Larger-sized glass substrates can be cut into larger and more panels to achieve the purpose of reducing costs and expanding economic benefits. As far as the existing liquid crystal panel production equipment is concerned, the T200 (array test) site is used as an electrical measurement site for the thin film transistor liquid crystal display (TFT-LCD) array test area. The main function of the T200 station is to measure the electrical value of the line in the glass substrate, and at the same time generate abnormal data information (such as abnormal type, position coordinates, etc.), and pass the abnormal information to T300 (final repair) through the data...

AI Technical Summary

Problems solved by technology

However, since the wiring of each panel is very precise, there may be deviations in the measurement, resulting in the failure of effective repairs at the T300 site, resulting in the need for retesting and repairing of abnormal products, thus wasting the measurement capacity of the T200 site and the repair capacity of the personnel at the T300 site

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