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System testing method and system test kit

A technology of tested and test sets, applied in software testing/debugging, detecting faulty computer hardware, error detection/correction, etc., can solve problems such as long-term problems, achieve reliable faults or errors, and reduce development effects

Inactive Publication Date: 2019-06-28
VESTEL ELEKTRONIK SANAYI & TICARET ANONIM SIRKETI
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Problems solved by technology

On the other hand, even just a single test cycle of device software for a complex system such as a TV requires a considerable period of time

Method used

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  • System testing method and system test kit
  • System testing method and system test kit
  • System testing method and system test kit

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Embodiment Construction

[0030] figure 1 A block diagram of a method of testing a system is schematically shown. exist figure 1 In , rectangular boxes with square corners represent artifacts, and oval boxes with rounded corners represent tools. Box 101 represents a system under test (SUT), eg a new version of a computer program, system or software embedded in an electronic device (hereinafter simply referred to as "device software"). Box 102 represents a static code analysis tool for performing static code analysis on device software 101 . Box 103 represents the result of the static code analysis, which may be one or more alerts, each alert indicating a respective error in the device software 101 . Block 104 represents using the results 103 of the static code analysis to adjust the model of the SUT, for example by modifying the statistical probabilities of one or more state transitions in the SUT model. Thus, block 105 represents the adjusted SUT model. Block 106 represents a model-based testing ...

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Abstract

The present invention provides a method of testing a system (101), such as a computer program, system or software which is embedded in an electronic device as firmware. The method at least comprises creating a model of the system under test, performing static code analysis on the system to generate one or more alerts (103), each respectively indicative of a respective error in the system under test, using the alerts to adapt the model (105) of the system, using the adapted model of the system to generate a test suite (107), and executing the test suite thus generated on the system under test.The present invention also provides a corresponding test kit comprising a static code analysis tool and a model-based testing tool, wherein the model-based testing tool uses results generated by the static code analysis tool. This system testing method and test kit have the advantage of allowing a part or parts of the system under test which require more testing than others to be identified by thestatic code analysis, and for the execution of the test suite on the system to be concentrated on those parts of the system more than on the others. Thus, the chance of exposing any faults, bugs or errors in the system can be increased, whilst the length of the test cycle can be reduced.

Description

[0001] The invention relates to a method of testing a system according to claim 1, a system test kit according to claim 8, an electronic device according to claim 10 or claim 11, a method of manufacturing an electronic device according to claim 13 and a system test kit according to claim 8. 14. A computer program product or program code or system according to claim 15. Background technique [0002] Consumer demand for new electronic devices means that consumers expect to see, in the shortest possible time, at the least possible cost, and in any computer program, system or software embedded in such a device (hereinafter referred to as "device software") Every new generation of technology with the fewest possible flaws or bugs present. This device software is often called firmware. This forces manufacturers of electronic devices to produce each new generation of device software as quickly as possible while maintaining its reliability. This has led these manufacturers to develo...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/36
CPCG06F11/3668G06F11/3696G06F11/27G06F11/3608G06F11/3684G06F11/3688G06F17/18
Inventor 杜伊古·梅廷塞伦·沙欣盖比兹利
Owner VESTEL ELEKTRONIK SANAYI & TICARET ANONIM SIRKETI
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