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Method for measuring deuterium and tritium depth distribution in solid matter

A deep-distributed, solid-matter technique

Active Publication Date: 2019-07-23
HEFEI INSTITUTES OF PHYSICAL SCIENCE - CHINESE ACAD OF SCI
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  • Abstract
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  • Application Information

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Problems solved by technology

[0003] However, all the above methods can only analyze a single deuterium or tritium in the substance to be measured. When deuterium and tritium may exist in the substance to be measured at the same time, none of the above methods can obtain the concentration depth distribution of deuterium and tritium in the substance to be measured at the same time. ; Currently proposed based on T(d,n) 4 He nuclear reaction or D(d,p) 3 The He nuclear reaction analysis method has a contradiction in physics, and the stopping power calculation in the analysis process does not consider the influence of the depth distribution of hydrogen isotopes, that is, the analysis results are inconsistent with the analysis process.

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  • Method for measuring deuterium and tritium depth distribution in solid matter
  • Method for measuring deuterium and tritium depth distribution in solid matter
  • Method for measuring deuterium and tritium depth distribution in solid matter

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Embodiment Construction

[0027] Such as figure 1 As shown, the present invention uses T(d,n) 4 The relationship between the α-particle energy spectrum of He nuclear reaction and the depth distribution of tritium, D(d,n) 1 The relationship between the proton energy spectrum of the H nuclear reaction and the depth distribution of deuterium, by establishing an analysis model that can analyze deuterium and tritium at the same time, the model is recalculated along with the iteration of the depth distribution of deuterium and tritium when dealing with deterrence power, the method of the present invention can prevent The depth distribution of deuterium and tritium in the substance to be measured can be obtained at the same time on the basis of self-consistent technology.

[0028] Implementation example of the present invention: the depth distribution of deuterium and tritium in the material titanium to be measured is specifically implemented as follows:

[0029] (1) Experimental measurement:

[0030] Deut...

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Abstract

The invention discloses a method for measuring deuterium and tritium depth distribution in a solid matter. Firstly, deuterium ions are used for bombarding the to-be-tested solid matter, then energy spectrums of protons and alpha particles generated in the bombarding process are measured, and then hydrogen isotope distribution information in the solid matter is obtained through a data processing module capable of self-consistent treatment of hydrogen isotope concentration depth distribution and stopping power. The method for measuring deuterium and tritium depth distribution in the solid matterhas the advantages that depth distribution of the two hydrogen isotopes namely deuterium and tritium in the solid matter can be analyzed simultaneously, and the stopping power is self-consistent in the analyzing results and in the analyzing process.

Description

technical field [0001] The invention relates to a method for measuring the depth distribution of deuterium and tritium in solid matter, belonging to the interdisciplinary fields of neutron physics, nuclear material research and the like. Background technique [0002] The depth distribution of deuterium and tritium in materials is a topic of common concern in nuclear material research, nuclear safety research, energy research and other fields, especially the distribution data of tritium in materials is very important for evaluating key issues such as tritium self-sustainment and tritium diffusion. The methods for measuring the depth distribution of deuterium and tritium in materials can be divided into destructive measurement methods and nondestructive measurement methods. Although the lossy method can obtain the content and distribution data of hydrogen isotopes in the sample [9] , but the tritium target cannot be used again. Non-destructive methods mainly include backscat...

Claims

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Application Information

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IPC IPC(8): G01T1/36
CPCG01T1/36Y02E30/10
Inventor 祝庆军陈舞辉刘松林
Owner HEFEI INSTITUTES OF PHYSICAL SCIENCE - CHINESE ACAD OF SCI
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