Computation method of greenhouse crop leaf area index

Abstract

The invention relates to the field of the greenhouse crops, and specifically relates to a computation method of a greenhouse crop leaf area index. The computation method comprises the following steps:dividing each plant of crop as a top layer, a middle layer and a bottom layer from top to bottom according to the height, recording the total number of the leaf in each layer when measuring every time; performing the characteristic length measurement by selecting the maximum leaf and the minimum leaf in each layer, and respectively computing the leaf area of the maximum leaf and the leaf area ofthe minimum leaf in each layer, thereby obtaining the leaf area average value, and taking the leaf area average value as the representative leaf area of the leaf characteristics at this layer; accumulating product values of the representative leaf area of various layers and the total leaf number of the layer to obtain the total leaf area of the single plant of crop, namely solving the leaf area index of the crop. The leaf area fitting value and the actual value fitting are extremely high, the solved leaf area index accuracy is high, the measurement process is simple in operation, and instrument use cost and the manpower cost are low.

Description

technical field [0001] The invention relates to the technical field of greenhouse crop research, in particular to a method for calculating the leaf area index of greenhouse crops. Background technique [0002] Leaf area index, also known as leaf area coefficient. It refers to the ratio of the total leaf area of ​​plants to the land area. It is related to the density, structure (single layer or multi-layer) of vegetation, the biological characteristics of trees (branch angle, leaf angle, shade tolerance, etc.) It is a comprehensive indicator of vegetation utilization of light energy and canopy structure. However, due to the diversity of crops, the leaves of many crops grow rapidly during the growth period, the workload required for direct measurement of leaf area is very large, and the requirements for measuring instruments and methods are relatively high. In order to find a more simple and effective method for calculating the leaf area index, I have studied the calculatio...

AI Technical Summary

Problems solved by technology

However, during the growth and development of crops, as the number of leaves gradually increases, the difficulty and workload of measuring leaf

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