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SD-OCT (Spectral-domain optical coherence tomography) image-based celadon ware glaze layer thickness measuring method

A technology of thickness measurement and glaze layer, which is applied in the field of automatic measurement of celadon glaze layer thickness, can solve the problems of destroying the physical measurement of porcelain and the inability to measure the thickness of the glaze layer, so as to improve the universality of measurement, ensure accuracy and robustness sex, efficiency-enhancing effect

Active Publication Date: 2019-08-20
ZHEJIANG UNIVERSITY OF SCIENCE AND TECHNOLOGY
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Problems solved by technology

The thickness of the glaze layer and the uniformity of the overall glaze thickness of the porcelain are one of the main factors to judge the quality of a piece of celadon. The traditional method of measuring the thickness of the celadon glaze layer is to destroy the porcelain for physical measurement. It has certain accuracy, but it cannot measure all parts of the porcelain. The thickness of the glaze layer is a method of destructive measurement, so it is of great significance to realize non-destructive measurement

Method used

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  • SD-OCT (Spectral-domain optical coherence tomography) image-based celadon ware glaze layer thickness measuring method
  • SD-OCT (Spectral-domain optical coherence tomography) image-based celadon ware glaze layer thickness measuring method
  • SD-OCT (Spectral-domain optical coherence tomography) image-based celadon ware glaze layer thickness measuring method

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specific Embodiment

[0055] 1, a kind of method for measuring the thickness of celadon glaze layer of SD-OCT image, it is characterized in that comprising the following steps

[0056] 1) Establish a database of refractive indices of different types of celadon glaze layers;

[0057] 1.1) Collect different types of celadon samples with known glaze thickness;

[0058] 1.2) Use the OQ LabScope system produced by Lumedica to collect the SD-OCT image of the celadon glaze layer, use the "Depth Per Pixel" parameter in the OQ LabScope system as the physical resolution Pr of each pixel in the SD-OCT image, use the system's automatic Use the caliper tool to measure the thickness of the celadon glaze layer and adjust the "Depth Per Pixel" parameter, and then adjust the physical resolution Pr until the thickness of the celadon glaze layer measured by the system's built-in caliper is the same as the actual thickness of the celadon glaze layer.

[0059] 1.3) Record the physical resolution Pr of each pixel of th...

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Abstract

The invention discloses an SD-OCT (Spectral-domain optical coherence tomography) image-based celadon ware glaze layer thickness measuring method. According to the method, the thicknesses of sample celadon ware glaze layers are measured, so that a database of the refractive indexes of different types of celadon ware glaze layers is built; the SD-OCT image of a celadon ware glaze layer is acquired;the SD-OCT image of the celadon ware glaze layer is filtered and binarized, the upper boundary of the glaze layer is positioned; edge detection is performed, so that structural elements are designed,the structural elements are adopted to perform closed operation on the image which has been subjected to edge detection, and the lower boundary of the celadon ware glaze layer is extracted; and the difference value of the upper boundary pixel and lower boundary pixel of the glaze layer is multiplied by the physical depth of each pixel, so that the thickness of the celadon ware glaze layer can be calculated. With the method disclosed by the invention adopted, the nondestructive real-time measurement of the thickness of the celadon ware glaze layer is realized; measurement precision reaches a micron level; high precision is realized; and the thicknesses of the glaze layers of various celadon wares can be measured according to the established celadon ware glaze layer refractive index database. The method has strong adaptability, and can improve measurement efficiency.

Description

technical field [0001] The invention belongs to the field of automatic measurement of celadon glaze layer thickness, and relates to a processing method of SD-OCT images, in particular to a method for measuring the thickness of celadon glaze layer of SD-OCT images. Background technique [0002] my country's ceramics have a long history, and celadon is one of the main types of ceramics, which has received extensive attention and research from people at home and abroad. The thickness of the glaze layer and the uniformity of the overall glaze thickness of the porcelain are one of the main factors to judge the quality of a piece of celadon. The traditional method of measuring the thickness of the celadon glaze layer is to destroy the porcelain for physical measurement, which has a certain accuracy, but cannot measure all parts of the porcelain. The thickness of the glaze layer is a method of destructive measurement, so it is of great significance to realize non-destructive measur...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01B11/06G01B21/04G01N21/41
CPCG01B11/0625G01B21/042G01N21/41
Inventor 周扬石龙杰刘铁兵施秧汪凤林黄俊陈正伟岑岗周武杰刘喜昂吴茗蔚吴迪陈芳妮陈才
Owner ZHEJIANG UNIVERSITY OF SCIENCE AND TECHNOLOGY