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Method and system for detecting macroscopic mura defects on large-size liquid crystal panel

A liquid crystal panel and detection method technology, applied in the field of image processing, can solve problems such as lack of mature technical solutions, achieve the effect of improving detection ability and efficiency, and enhancing images

Inactive Publication Date: 2019-08-27
武汉中导光电设备有限公司
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  • Description
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  • Application Information

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Problems solved by technology

[0003] In the field of large-scale LCD panel production, there is currently no mature matching AOI equipment on the market. For the defect detection that affects the visual effect of the display screen in the field of large-scale LCD panel production, there is still no mature technical solution.

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  • Method and system for detecting macroscopic mura defects on large-size liquid crystal panel

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Embodiment Construction

[0049] Embodiments of the present invention will be described in further detail below in conjunction with the accompanying drawings.

[0050] see figure 1 As shown, an embodiment of the present invention provides a method for detecting macroscopic mura defects on a large-size liquid crystal panel, the method comprising:

[0051] Step S1: Collect several frame images of different regions on the liquid crystal panel to be inspected according to the preset frequency and relative motion path;

[0052] Step S2: Stitching all the collected frame images into a complete panorama according to the physical coordinates of the frame images;

[0053] Step S3: Using an image compression algorithm to iteratively compress the complete panorama multiple times to obtain a compressed image of the liquid crystal panel to be inspected;

[0054] Step S4: performing compensation processing on the compressed image of the liquid crystal panel to be inspected to obtain a preprocessed image of the liq...

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Abstract

The invention discloses a method for detecting macroscopic mura defects on a large-size liquid crystal display panel. The method comprises the following steps of collecting a plurality of frame imagesof different areas on a liquid crystal display panel to be detected according to a preset frequency and a relative motion path, splicing all the collected frame images into a complete panorama according to the physical coordinates of the frame images, iteratively compressing the complete panorama for multiple times by using an image compression algorithm to obtain a compressed image of the liquidcrystal display panel to be detected, carrying out compensation processing on the compressed image of the to-be-detected liquid crystal display panel to obtain a preprocessed image of the to-be-detected liquid crystal display panel, carrying out the contrast enhancement processing on the preprocessed image of the liquid crystal panel to be detected by using a contrast-limited adaptive histogram equalization algorithm, and carrying out binary morphological processing on the enhanced pre-processed image to obtain an adaptive binary image, the adaptive binary image comprising a plurality of spots used for representing the macroscopic mura defect information, and obtaining the macroscopic mura defect information according to the spots.

Description

technical field [0001] The invention relates to the field of image processing, in particular to a detection method and system for macroscopic mura defects on a large-size liquid crystal panel. Background technique [0002] In the production process of liquid crystal panels, due to technical problems, there will be some macroscopic mura defects on the panel that will affect the visual effect of the display screen. These macroscopic mura defects mainly include point defects, linear defects and mura defects. With the development of technology , Artificial visual inspection for the judgment of defects is gradually unable to meet today's industrial requirements, the industry has gradually begun to pay attention to and try to use automatic optical inspection (Automatic Optic Inspection, AOI) defects, that is, machine vision systems to assist visual inspection. At present, the AOI equipment used to detect defects on the market is mainly concentrated in the fields of small size and ...

Claims

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Application Information

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IPC IPC(8): G06T7/00G06T3/40G06T5/00G06T7/12G06T7/136
CPCG06T7/0008G06T3/4038G06T7/12G06T7/136G06T2207/20036G06T2207/30121G06T5/77G06T5/90
Inventor 张虎
Owner 武汉中导光电设备有限公司
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