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Two-dimensional scanning wide-format imaging platform scanning control method

A two-dimensional scanning and scanning control technology, applied in the direction of feedback control, electric speed/acceleration control, etc., can solve problems such as unfavorable image processing and complex algorithms, and achieve the effect of simple calculation and high precision

Active Publication Date: 2019-10-22
XI'AN INST OF OPTICS & FINE MECHANICS - CHINESE ACAD OF SCI
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  • Application Information

AI Technical Summary

Problems solved by technology

[0003] The invention proposes a new scanning control method for a two-dimensional scanning wide-format imaging platform, which solves the problems of complex control algorithms in the prior art, which are not conducive to later image processing and three-dimensional mapping, etc.

Method used

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  • Two-dimensional scanning wide-format imaging platform scanning control method
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  • Two-dimensional scanning wide-format imaging platform scanning control method

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Experimental program
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Effect test

Embodiment 1

[0024] Embodiment one, see figure 1 :

[0025] 1) Assuming that the wide scanning angle is -50°~+10°, and the period of each scanning strip is 3s, the scanning angular rate can be calculated as

[0026]

[0027] 2) The local horizontal scanning coordinate system M is perpendicular to the scanning strip, and the yaw angle of the local horizontal scanning coordinate system M is taken is the initial yaw angle;

[0028] 3) The first scanning strip starts, t=0, the initial value of the rolling Euler angle Initial value of pitch Euler angle θ Los = 0°, ω FOV Take it as +20° / s;

[0029] 4) Take the sampling time Δt s = 100ms, every 100ms synchronously collects the output data of the POS system installed on the base of the two-dimensional scanning stable platform, including the yaw angle Pitch angle θ, roll angle Northeast velocity vector And the data R measured by the laser rangefinder in the pitch inner frame LOS ;

[0030] 5) According to the initial yaw angle ...

Embodiment 2

[0048] Embodiment two, see figure 2 :

[0049] 1) Assuming that the wide scanning angle is -50°~+10°, and the period of each scanning strip is 3s, the scanning angular rate can be calculated as

[0050]

[0051] 2) The first scanning strip starts, t=0, the initial value of the rolling Euler angle Initial value of pitch Euler angle θ Los = 0°, ω FOV Take it as +20° / s.

[0052] 3) Take the sampling time Δt s = 100ms, synchronously collect the position and attitude data output by the POS system installed on the base of the two-dimensional scanning stable platform every 100ms, including the yaw angle Pitch angle θ, roll angle Northeast velocity vector Longitude log, latitude lat, altitude h, and data R measured by the laser rangefinder in the pitch inner frame LOS .

[0053] 4) According to the initial yaw angle Calculate the transformation matrix from the geographic coordinate system N to the local horizontal coordinate system L

[0054]

[0055] 5) Calcula...

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Abstract

The invention discloses a two-dimensional scanning wide-format imaging platform scanning control method. The method comprises according to the requirement of a wide-format imaging range, performingcalculation based on a flight speed attitude in a real-time flight state; synthesizing a scanning instruction angle of the outer roll frame and the inner pitch frame of a two-dimensional scanning stable platform in real time; based on the synthesized instruction, using a roll encoder and a pitch encoder as feedbacks to rotate the two-dimensional scanning platform so as to achieve complete wide scanning within a specified angle range. The method is simple instruction calculation and high in precision, and is suitable for an aerial wide-format imaging two-dimensional scanning stable platform for.

Description

technical field [0001] The invention relates to a scanning control method of a two-dimensional scanning stable platform for area array wide-width imaging. Background technique [0002] At present, lens stitching technology is mostly used in domestic wide-format imaging, and there are few technologies that use area array swing-sweep to realize wide-format imaging. The existing area array wide-width swing-sweep stable platform generates Euler speed scanning commands, which cannot be directly compared with the measurement feedback components to complete the control, and requires complex conversions, which is not conducive to the alignment between scanning strips and is not conducive to the later stage Image processing and 3D mapping. Contents of the invention [0003] The invention proposes a new scanning control method for a two-dimensional scanning wide-width imaging platform, which solves the problems of complex control algorithms in the prior art, which are unfavorable f...

Claims

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Application Information

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IPC IPC(8): G05D3/12G05D13/62
CPCG05D3/12G05D13/62
Inventor 常三三高波陈卫宁刘广森易波
Owner XI'AN INST OF OPTICS & FINE MECHANICS - CHINESE ACAD OF SCI
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