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A memory based on hysteretic characteristic device

A hysteresis characteristic, memory technology, applied in static memory, digital memory information, information storage and other directions, can solve the problem of write operation delay, write operation power consumption, process stability and compatibility, insufficient device durability, and cannot be completely replaced, etc. problem, to solve the effect of reducing the memory data rate, avoiding occupation, and improving the refresh operation

Active Publication Date: 2019-11-08
TSINGHUA UNIV
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Problems solved by technology

At present, more mature non-volatile memories include flash memory (Flash), STT-MRAM, ferroelectric memory (FeRAM) and other solutions, but the above-mentioned solutions have disadvantages in write operation delay, write operation power consumption, process stability and compatibility, and device There are certain deficiencies in durability and other aspects, so it cannot completely replace the traditional CMOS memory structure at present.

Method used

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  • A memory based on hysteretic characteristic device
  • A memory based on hysteretic characteristic device
  • A memory based on hysteretic characteristic device

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Embodiment Construction

[0033] Embodiments of the present invention are described in detail below, examples of which are shown in the drawings, wherein the same or similar reference numerals designate the same or similar elements or elements having the same or similar functions throughout. The embodiments described below by referring to the figures are exemplary and are intended to explain the present invention and should not be construed as limiting the present invention.

[0034] A memory based on a hysteresis characteristic device according to an embodiment of the present invention will be described below with reference to the accompanying drawings.

[0035] image 3 It is a schematic diagram of a memory structure based on a hysteresis characteristic device according to an embodiment of the present invention.

[0036] Such as image 3 As shown, a memory 10 based on a hysteresis device includes: an information storage module 100 , a write operation module 200 and a read operation module 300 .

[0...

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Abstract

The invention discloses a unit circuit of a memory based on a hysteretic characteristic device and an array circuit composed of a plurality of unit circuits. The memory unit circuit comprises an information storage module, a write operation module and a read operation module, the information storage module comprises a write operation end and a read operation end, is mainly composed of units with hysteretic characteristics, and stores information by utilizing the state of the hysteretic characteristics; the write operation module is connected with the write operation end, the write operation module is connected with information stored in the control information storage module, the write control circuit can reset the hysteresis characteristic state of the storage unit into a certain intervalof a hysteresis curve before the hysteresis characteristic state of the storage unit deviates from the corresponding hysteresis area, and the reset operation does not need to obtain the stored information in advance; the read operation module is connected with the read operation end, and the connection acquires state storage information in the information storage module. According to the memory,information storage is realized through a device with hysteretic characteristics, so that reading operation does not need to be performed in advance during refreshing, and the refreshing operation issimplified.

Description

technical field [0001] The invention relates to the technical field of low-power memory structure, in particular to a memory based on a hysteresis characteristic device, including a unit circuit of the type memory and an array circuit composed of a plurality of the unit circuits. Background technique [0002] At present, with the rise of technologies such as artificial intelligence and the Internet of Things, the continuous increase of the total amount of data makes people's requirements for storage capacity, read and write speed, service life and low power consumption of the memory are also rising. Since dynamic random access memory (DRAM, dynamic random access memory) has the advantages of high storage density and fast read and write speed, most computer systems use DRAM as the main storage part. [0003] DRAM mainly stores information through the charge on the capacitor, and due to the existence of transistor leakage current, the charge stored on the capacitor will gradua...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G11C11/22G11C11/406
CPCG11C11/22G11C11/406
Inventor 古明阳李学清刘勇攀杨华中
Owner TSINGHUA UNIV
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