An automatic test method and system for a comprehensive tester

Abstract

The present invention provides an automatic test method and system for a comprehensive test instrument. The automatic test method for a comprehensive test instrument includes the following steps: step S1, setting test parameters, configuring test content; step S2, passing the first comprehensive test instrument and the second The comprehensive tester reads the test parameters of the device under test in parallel, captures and analyzes the WLAN signal sent by the device under test, and obtains the test index data; step S3, respectively obtains the data of the first comprehensive tester and the second comprehensive tester through the API interface. The test results are then displayed in a list. The present invention can effectively improve test efficiency, and it only takes about 2 hours to complete a WLAN-type tested device after automatic testing; it can prevent mistesting and realize automatic test result output; it can effectively improve comparison accuracy, and through parallel The first comprehensive tester and the second comprehensive tester capture and analyze signals to eliminate delay and make the results more consistent and effective; the operation is simple and the testers are easy to use.

Description

technical field [0001] The invention relates to a comprehensive tester testing method, in particular to a comprehensive tester automatic test method, and to an comprehensive tester automatic test system using the comprehensive tester automatic test method. Background technique [0002] A comprehensive tester, such as a WLAN comprehensive tester, requires a combination of software and hardware to use the system. To test the TX scheme (transmission scheme) of the device under test (DUT), all signals are analyzed by the hardware and software of the WLAN comprehensive tester, and are transmitted through the software GUI interface. Present a lot of key indicator data, and then use these key indicator data to judge the quality of the device under test (DUT), and finally judge whether the device under test (DUT) meets the requirements for external release. [0003] The comprehensive tester test method in the prior art is mainly implemented in a manual manner, which mainly has the f...

AI Technical Summary

Problems solved by technology

[0003] The comprehensive tester test method in the prior art is mainly implemented in a manual manner, which mainly has the following defects and deficiencies: first, it is very time-consuming, and it is necessary to manually control the device under test (DUT) and manually Separately control the comprehensive testing instrument to collect and analyze, and then record a lot of relevant index data separately. This is just a round of testing process

In the process of this comparison experiment, many scenarios such as different parameters in the device under test (DUT), different parameters in the analysis options, etc. need to be traversed, and many rounds of test experiments are required, which shows the seriousness of time-consuming

[0004] Second, it is not accurate enough. The signal sent by the device under test (DUT) itself has certain instability, and manual testing, even if it is tested by two comprehensive testers, these two comprehensive testers are also time-sharing tests. If there is a certain time difference, the comparison of test data between the two cannot exclude the instability factor of the device under test (DUT) itself.

[0005] Third, it is easy to make mistakes. Since there is not only one index to be compared in the test experiment, there are many index data that need to be recorded manually. In addition, there are many scenarios and test types. It is easy for the staff to operate and record the data for a long time. go wrong

Images