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Multilayer ceramic capacitor

A technology of multilayer ceramics and capacitors, applied in the direction of multilayer capacitors, fixed capacitor electrodes, fixed capacitor dielectrics, etc. problem to achieve high efficiency

Pending Publication Date: 2019-11-15
GUANGDONG FENGHUA ADVANCED TECH HLDG
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, the other two opposite cut surfaces of the laminate generally do not have internal electrode lead-out edges or other marks, so the degree of cutting deviation in the other cutting direction cannot be directly observed. It is necessary to cut the laminate to expose the internal electrodes. Partial testing is inconvenient, and the efficiency of testing and sorting is low

Method used

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  • Multilayer ceramic capacitor
  • Multilayer ceramic capacitor
  • Multilayer ceramic capacitor

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0045] An embodiment of the multilayer ceramic capacitor of the present invention, the specific structure of the multilayer ceramic capacitor described in this embodiment is combined with the attached Figure 1-7 To illustrate:

[0046] combine figure 1 , figure 2 , image 3 with Figure 4, the multilayer ceramic capacitor 100 includes a ceramic body 10 , a first external electrode 20 and a second external electrode 30 . The ceramic body 10 is composed of a plurality of ceramic dielectric layers 12 stacked to form a cuboid with six sides, including an upper surface S1, a lower surface S2, a first end surface S3, a second end surface S4, a first side surface S5 and a second side surface S6. The surface S1 and the lower surface S2 are opposite to each other and perpendicular to the stacking direction Z of the ceramic dielectric layer 12, the first end surface S3 and the second end surface S4 are opposite to each other and perpendicular to the direction X, and the first side...

Embodiment 2

[0062] An embodiment of the multilayer ceramic capacitor of the present invention, the specific structure of the multilayer ceramic capacitor described in this embodiment is combined with the attached Figure 8-9 To illustrate:

[0063] combine Figure 8 , the difference from Embodiment 1 is that the lead-out portion 142 is an isosceles trapezoid. The lower base AB of the lead-out portion 142 is on the first end surface S3, and AB forms a gap with the first side S5 and the second side S6. The distance from the end point A to the first side S5 is a, the distance from the end point B to the second side S6 is b, and a=b. The length of line segment AB is c. A gap is formed between the upper bottom edge CD of the lead-out portion 142 and the second end surface S4. The main body portion 144 is rectangular. An edge EF of the main body portion 144 coincides with an upper bottom edge CD of the lead-out portion 142 .

[0064] The first internal electrode 14 and the second internal...

Embodiment 3

[0067] An embodiment of the multilayer ceramic capacitor of the present invention, the specific structure of the multilayer ceramic capacitor described in this embodiment is combined with the attached Figures 10-14 To illustrate:

[0068] combine Figure 10 , the difference from Embodiment 2 lies in that the lead-out portions of the first internal electrode 14 and the second internal electrode 16 are both right-angled and trapezoidal. The upper base AB of the lead-out portion 142 is on the first end surface S3 , the lower base CD coincides with one side EF of the main body 144 , and the waist AC perpendicular to the base is on the first side S5 . A gap is formed between the end point D and the second side S6. When the first external electrode 20 is not formed on the ceramic body 10 , the line segment AB can be observed on the first end surface S3 . The length of the line segment AB is a, the length of the line segment CF is b, the length of the line segment CD is c, the le...

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Abstract

The invention discloses a multilayer ceramic capacitor. The ceramic body includes an upper surface, a lower surface opposite to the upper surface, a first end surface, a second end surface opposite tothe first end surface, a first side surface, and a second side surface opposite to the first side surface. At least one internal electrode is included, and the internal electrode is stacked on surfaces of different ceramic dielectric layers. The internal electrode comprises a main body portion and a lead-out portion, the main body portion is rectangular, the lead-out portion is trapezoidal, one bottom of the lead-out portion overlaps the first end surface, another bottom of the lead-out portion overlaps one end of the main body portion, another end of the main body portion extends toward thesecond end surface along a surface of the ceramic dielectric layer with a gap. According to the multilayer ceramic capacitor, the degree of cut deviation in two cutting directions can be easily inspected without splitting a laminated body, even the degrees of cut deviation in two cutting directions can be inspected simultaneously from only one surface of the laminated body, and the efficiency of inspection and sorting of defective products of cut deviation is high.

Description

technical field [0001] The invention relates to the field of electronic components, in particular to a multilayer ceramic capacitor. Background technique [0002] Usually, in the manufacturing process of multilayer ceramic capacitors, a plurality of ceramic diaphragms printed with internal electrodes are stacked to form a green substrate, and then the green substrate is compacted by lamination, and then cut into a rectangular parallelepiped laminated body. Complete the green molding of multilayer ceramic capacitors. When cutting, due to reasons such as cutting accuracy, there will be a phenomenon of cutting deviation. If the degree of off-cutting is light, the off-cutting will generally not cause adverse effects; but if the offset exceeds the allowable range of the process, there will be hidden dangers in the reliability of the capacitor. Therefore, when off-cutting occurs, defective products with unacceptable off-cutting degree should be sorted out in time. [0003] Gene...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01G4/005H01G4/232H01G4/30H01G4/12
CPCH01G4/012H01G4/232H01G4/30H01G4/12
Inventor 陆亨卓金丽蒋利群黄昌蓉
Owner GUANGDONG FENGHUA ADVANCED TECH HLDG