Sharpening method for probe tip of atomic force microscope

Abstract

The invention discloses a sharpening method for a probe tip of an atomic force microscope and relates to the technical field of precision engineering. The method comprises a step of dropping a prepared solution on a glass slide on an atomic force microscope workbench to form liquid drops on the glass slide, wherein a solute of the prepared solution is diamond powder, a step of infiltrating a tip of a probe to be ground with the prepared solution, a step of setting the working mode of the atomic force microscope as an under-liquid tapping mode and controlling the tip of the probe to be ground to approach a surface of the glass slide until a cantilever beam of the probe to be ground is completely immersed in the liquid drops on the surface of the glass slide, a step of setting probe vibration parameters, probe scanning parameters and a sharpening time and start to sharpen the tip of the probe to be sharpened, and a step of evaluating a sharpened probe tip to finish sharpening. Accordingto the method, the probe tip is sharpened through a self-excited oscillation probe tip and the grinding effect of diamond particles in the solution in an atomic force microscope under-liquid tapping mode, and the method is simple and effective and is easy to implement.

Description

technical field [0001] The invention relates to the technical field of precision engineering, in particular to a method for sharpening the probe tip of an atomic force microscope. Background technique [0002] Since the advent of atomic force microscopes (AFM), it has been widely used in the atomic scale research of chemical, biological and engineering materials, which has brought great opportunities for the development of nanoscience. The essence of AFM imaging is that when the probe tip scans the sample surface, the surface of the probe tip and the sample surface are in contact with each other, thereby generating a convolution image of the probe tip and the sample surface, and the imaging result includes the geometric information of the probe tip. It also includes the geometric information of the sample surface. Therefore, the AFM image of a particular sample will vary as the size of the probe tip changes. The tip size of the probe has also become one of the key factors ...

AI Technical Summary

Problems solved by technology

Because the probe will inevitably wear the needle tip of the probe during use or irregular operation, the radius of curvature of the needle tip will increase, or even fail.

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