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Method and system for testing power efficiency of CPU, and related component

A test method and technology of power supply efficiency, applied in the direction of power supply test, faulty hardware test method, faulty computer hardware detection, etc., can solve the problem of low Vout

Active Publication Date: 2019-12-24
GUANGDONG INSPUR BIG DATA RES CO LTD
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0006] However, in the second method, the GEN2_Efficiency_pod is connected to the motherboard circuit by cable welding, and the input voltage is detected on the GEN2_Efficiency_pod side of the cable, resulting in a high measured Vin; and the Vout measurement point is on the test pin of the GEN5_VR_test_tool. Caused the measured Vout to be low

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  • Method and system for testing power efficiency of CPU, and related component
  • Method and system for testing power efficiency of CPU, and related component
  • Method and system for testing power efficiency of CPU, and related component

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Embodiment Construction

[0040] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0041] In the prior art, the power supply test method based on the Purley platform needs to be manually loaded, and the operation is very time-consuming; the power supply test method based on the Whitley platform is far away from the test point, resulting in inaccurate test results. In the present invention, the Vin test point is located at the input capacitance of PVCCIN, and the Vout test point is located at the output inductance of PVCCIN, so the input volta...

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Abstract

The invention discloses a method, a system and a device for testing the power efficiency of a CPU, and a readable storage medium. The method comprises the steps of: connecting a Vin test point to an input capacitor of a PCICIN of a motherboard, connecting a Vot test point to an output inductor of the PVCCIN, and welding a load pull line of a precision resistor at an input inductor of the PVCCIN; setting a load pull current valve in a DC_Load.py program according to a test report; and running the DC_Load.py program to perform current load pull and to perform data collection. Since the Vin testpoint is located at the input capacitor of the PCICIN, and the Vot test point is located at the output inductor of the PVCCIN, an input voltage Vin and an output voltage Vout can be measured more accurately, errors in the prior art are solved, and meanwhile the DC_Load.py program is used for performing automatic load pull, so that the test speed is ensured.

Description

technical field [0001] The invention relates to the field of server hardware testing, in particular to a testing method, system and related components of CPU power supply efficiency. Background technique [0002] When testing the power supply of the server motherboard, it is necessary to test the efficiency of the power supply, especially the strict test for the PVCCIN power supply of the CPU. Currently, there are two methods for testing the efficiency of the PVCCIN power supply of the CPU: [0003] One is on the purley platform, routinely use GEN4_VR_test_tool to manually operate the load, the input terminal is connected in series with a precision resistor, and the data acquisition instrument or multimeter collects the input voltage Vin, input current Iin, and output voltage Vout. This method is manually loaded, and the interval between each collection is usually more than 10s, and the operation is time-consuming. [0004] The second is to test on the whitley platform thr...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/40G06F11/22
CPCG01R31/40G06F11/2205G06F11/2273
Inventor 齐雪宝
Owner GUANGDONG INSPUR BIG DATA RES CO LTD