Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

A Debugging Method for Parallel Grating Surface of Compressor in Ultrashort Pulse Laser System

An ultra-short pulse laser and compressor technology, which is applied to lasers, laser parts, phonon exciters, etc., can solve the problems of many professional instruments, complicated monitoring optical path structure and adjustment ideas, and complicated operation, etc. Intuitive principle and high precision effect

Active Publication Date: 2021-05-18
LASER FUSION RES CENT CHINA ACAD OF ENG PHYSICS
View PDF8 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

During the debugging process, the positions of the collimated light source and the right-angle prism need to be changed, the operation is cumbersome, and the optical path needs to be rebuilt every time debugging
Xia Suqiu and others proposed to use the autocorrelator and the far-field detector composed of Fabry-Perot interferometer, dispersive mirror and CCD to monitor and adjust the angular misalignment of the grating on-line (see On-line monitoring of optical pulse compressor grating misalignment and Adjustment method, China Laser, 2016, 43(8)), this method requires many professional instruments, and the structure of the monitoring optical path and adjustment ideas are complicated. It is suitable for professionals who are familiar with the principle and structure of the entire system

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A Debugging Method for Parallel Grating Surface of Compressor in Ultrashort Pulse Laser System
  • A Debugging Method for Parallel Grating Surface of Compressor in Ultrashort Pulse Laser System
  • A Debugging Method for Parallel Grating Surface of Compressor in Ultrashort Pulse Laser System

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0036] Such as figure 1 and figure 2 As shown, a parallel debugging method for the grating plane of the ultrashort pulse laser system compressor, including the following steps:

[0037] S1. Use the spatial spectrum interference information of the upper sub-aperture and the lower sub-aperture of the reference light and the output light of the compressor to adjust the parallelism of the face of the compressor grating in the vertical direction, specifically:

[0038] S11: Select the upper sub-aperture D of the output light of the compressor 上 and lower sub-caliber D 下 ;

[0039] S12: Collect the reference light and the upper sub-aperture D of the compressor output light 上 The space-spectrum interference information of , mark the position P of the extreme point of the space-spectrum interference fringe in the horizontal direction 上 , as shown in Figure 3, Figure 3(a) shows that there are extreme points in the space-spectrum interference fringes, and the binarization process ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to a parallel debugging method for a compressor grating surface of an ultra-short pulse laser system, which belongs to the technical field of grating adjustment. The compressor grating is adjusted by using the space-spectrum interference information of the upper sub-aperture and the lower sub-aperture of the reference light and the output light of the compressor. The planes in the vertical direction are parallel, and the space-spectrum interference information of the left sub-aperture and the right sub-aperture of the output light of the compressor is used to adjust the plane parallelism of the compressor grating in the horizontal direction. The invention has an intuitive principle and simple operation. , High precision, can realize parallel fine adjustment of the compressor grating in the vertical direction and horizontal direction at the same time, without affecting the main laser light path, and can be realized online.

Description

technical field [0001] The invention belongs to the technical field of grating adjustment, and in particular relates to a parallel debugging method for a compressor of an ultrashort pulse laser system. Background technique [0002] Ultrashort ultraintense pulse laser is an important tool for studying the interaction between laser and matter. Chirped pulse amplification is the most commonly used method to generate ultra-short and ultra-intense pulse laser. The limit output pulse is obtained by stretching-amplifying-compressing the pulsed laser source. In a chirped pulse amplification system, the compressor is a key component and generally consists of a pair of parallel gratings. When the surface of the compressor grating is parallel to the reticle, and the introduced negative dispersion compensates the positive dispersion introduced by the pulsed laser source during the stretching and amplifying process, the system can obtain the limit output pulse. [0003] The adjustment ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G02B7/00H01S3/00
CPCG02B7/00H01S3/0057
Inventor 母杰王逍左言磊曾小明胡必龙周凯南李伟王晓东吴朝辉粟敬钦
Owner LASER FUSION RES CENT CHINA ACAD OF ENG PHYSICS
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com