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Optical superlattice polarization quality measurement method and device

A technology for optical superlattice and mass measurement, which is applied in the field of optical measurement and can solve the problems of incapable of superlattice polarization quality evaluation.

Active Publication Date: 2020-03-27
NANJING NANZHI INST OF ADVANCED OPTOELECTRONIC INTEGRATION NANJING
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  • Application Information

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Problems solved by technology

However, this method requires the use of a microscope and manual processing of the image in many steps
Patent CN103674895B proposes a period measuring instrument for superlattice materials, but this instrument can only measure the superlattice period, and cannot evaluate the polarization quality of the superlattice

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  • Optical superlattice polarization quality measurement method and device
  • Optical superlattice polarization quality measurement method and device
  • Optical superlattice polarization quality measurement method and device

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[0058]The embodiments will be described in detail hereinafter, examples of which are illustrated in the accompanying drawings. When the following description refers to the accompanying drawings, the same numerals in different drawings refer to the same or similar elements unless otherwise indicated. The implementations described in the following examples do not represent all implementations consistent with this application. These are merely examples of systems and methods consistent with aspects of the present application as recited in the claims.

[0059] Please refer to figure 1 and figure 2 , figure 1 It is a functional block diagram of an optical superlattice polarization quality measurement method in an embodiment of the present application; figure 2 It is a topography diagram of an etched optical superlattice in an embodiment of the present application.

[0060] combine figure 1 and figure 2 , the basic principle adopted in this application is: the laser 202 is...

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Abstract

The invention discloses an optical superlattice polarization quality measurement method. The method comprises the following steps that a laser device emits a laser beam to a superlattice sample, and amulti-stage diffraction pattern of the laser beam is obtained; the diffraction light intensity of the multi-stage diffraction pattern is measured, and a corresponding diffraction order is obtained; the duty ratio in the irradiation position of the superlattice sample is obtained according to the diffraction order and the corresponding diffraction light intensity; and an effective nonlinear coefficient reflecting the polarization quality of the irradiation position is obtained on the basis of the duty ratio. Via the measuring method, polarization quality measurement is easier, a measuring device is not tedious, and the measuring precision is high. In addition, the invention also discloses an optical superlattice polarization quality measurement device.

Description

technical field [0001] The present application relates to the technical field of optical measurement, in particular to a method for measuring the polarization quality of an optical superlattice. In addition, the present application also relates to an optical superlattice polarization quality measurement device. Background technique [0002] The concept of Quasi-Phase-Matching (QPM) was proposed by J.Armstrong and N.Bloembergen in 1962, nearly 40 years ago. Although the QPM theory was proposed very early, due to the difficulty in the preparation of periodically polarized crystals, it was not until the early 1980s that researchers at Nanjing University introduced microstructures into dielectrics and developed a dielectric superlattice (Dielectric Superlattice) , people began to explore the QPM experimentally. Since in the dielectric superlattice, the parameter to be periodically modulated is mainly the second-order nonlinear coefficient χ(2), the dielectric superlattice is a...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N21/47
CPCG01N21/4788
Inventor 尹志军吴冰倪荣萍许志城
Owner NANJING NANZHI INST OF ADVANCED OPTOELECTRONIC INTEGRATION NANJING