Device for rapidly moving and positioning emittance measuring instrument
A technology of positioning launch and fast movement, which is applied in measuring devices, radiation measurement, X/γ/cosmic radiation measurement, etc. It can solve problems such as long time required and equipment impact, achieve step-by-step subdivision, increase service life, The effect of reducing vibration force
Pending Publication Date: 2020-01-21
CHINA INSTITUTE OF ATOMIC ENERGY
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Problems solved by technology
[0004] Defects in the above-mentioned technology: In the above-mentioned technology and most of the emissivity measuring instruments at present, the stepper motor controls the head of the measuring instrument to move to the beam for measurement. Because the moving distance is too long, it takes a long time. During the time when the stepper motor controls the movement of the head of the measuring instrument, the ion source beam is in an unobstructed state in the injection line. If the beam intensity is high, it will have unnecessary effects on other equipment
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Embodiment
[0048] Embodiment: a kind of device of rapidly moving positioning emittance measuring instrument, such as figure 1 As shown, it includes a support frame 1, a signal chamber 2 installed on the support frame 1, a pneumatic device 3 and a fine-tuning device 4; the lower end of the support frame 1 is bolted with a large sealing flange 5, and the bottom of the large sealing flange 5 is arranged There is a measuring instrument head 6. When measuring the emittance of the ion source, install the large sealing flange 5 on the vacuum chamber where the ion source is located, and the pneumatic device 3 drives the signal chamber 2 and the measuring instrument head 6 to move quickly for a certain distance , and then the fine-tuning device 4 controls the movement of the signal chamber 2 and the measuring instrument head 6, so that the measuring instrument head 6 moves to the beam current area, and measures the emittance of the ion source, and the pneumatic device 3 drives the initial displace...
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The invention discloses a device for rapidly moving and positioning an emittance measuring instrument, and belongs to the technical field of beam flow diagnosis and detection. According to the key points of the technical scheme, the device comprises a supporting frame, a large sealing flange located below the supporting frame, a signal chamber mounted on the supporting frame and a measuring instrument head connected with the signal chamber, wherein a pneumatic device and a fine adjustment device are further arranged on the supporting frame; the pneumatic device is connected with the fine adjustment device; and the fine adjustment device and the signal chamber are connected together. The device solves the problem that beam flow with the relatively large intensity easily influences other equipment because the measuring instrument head needs a relatively long time to move to a beam flow area, achieves the effect of enabling the measuring instrument head to quickly move to the beam flow area for performing measurement in time, and avoids the influence of the beam flow on other equipment.
Description
technical field [0001] The invention relates to the technical field of beam current diagnosis and detection, more specifically, it relates to a device for rapidly moving and positioning an emittance measuring instrument. Background technique [0002] The emittance of the ion source is an important index to adjust and optimize the beamline, so the measurement of the emittance is very important. In the process of measuring the emittance of the injection line of the accelerator ion source, it is necessary to insert the head of the measuring instrument from the vertical direction of the injection line, move to the initial measurement position at the front end of the beam area, and then scan step by step under the control of the stepping motor. [0003] Now you can refer to the Chinese invention patent whose authorized announcement number is CN104090292B, which discloses a position-sensitive detector for high-energy heavy ion beam diagnosis. The beam probe is fixedly connected t...
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IPC IPC(8): G01T1/29G01T7/00
CPCG01T1/2907G01T1/2964G01T7/00
Inventor 刘振威符振辉管峰平温立鹏
Owner CHINA INSTITUTE OF ATOMIC ENERGY