Improved wavelet threshold denoising-based fault diagnosis method and improved wavelet threshold denoising-based fault diagnosis system

A wavelet threshold denoising and fault diagnosis technology, applied in instrument, calculation, character and pattern recognition, etc., can solve the problems of signal distortion, weak process variation analysis and detection ability, and inability to comprehensively use the soft threshold method. The effect of reliability

Active Publication Date: 2020-01-21
QILU UNIV OF TECH
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

But there are also some disadvantages in these methods: for example, the soft threshold method has a constant deviation, which will cause signal distortion; the signal after the hard threshold method is not smooth after noise reduction, and will generate additional oscillations
[0017] (1) The traditional threshold method fixedly adopts the soft threshold method or hard threshold method on each scale, and does not consider the selection based on the characteristics of the wavelet coefficients of each layer Appropriate threshold function, lack of flexibility, can not make full use of the advantages o

Method used

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  • Improved wavelet threshold denoising-based fault diagnosis method and improved wavelet threshold denoising-based fault diagnosis system
  • Improved wavelet threshold denoising-based fault diagnosis method and improved wavelet threshold denoising-based fault diagnosis system
  • Improved wavelet threshold denoising-based fault diagnosis method and improved wavelet threshold denoising-based fault diagnosis system

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Embodiment

[0113] In this embodiment, the TE process data set is used. The TE process was developed by Eastman Chemical Company to provide a realistic industrial process for evaluating process control and monitoring methods. TE process data has been commonly used in the field of fault diagnosis and process monitoring as a data source for comparing various methods. The TE process includes five main unit operations: reactor, condenser, cycle, compressor, separator, and stripper, and there are 21 types of failures in the TE process. There are 12 operating variables and 41 measured variables in this process, including 15 known disturbances and 6 working modes. The entire test data set includes a training set and a test set. The data in the dataset consists of 22 different simulated data, and each sample in the dataset has 52 observed variables. Each training set test sample represents a failure. Figure 4 is the TE process flow diagram.

[0114] The experimental environment is Windows 7...

Embodiment 2

[0121] Embodiment 2, this embodiment also provides a fault diagnosis system based on improved wavelet threshold denoising;

[0122] Fault diagnosis system based on improved wavelet threshold denoising, including:

[0123] An acquisition module configured to: acquire TE process (Tennessee Eastman Process, TE process is a process of real simulation of a chemical process) data to be diagnosed; standardize the acquired data;

[0124] A wavelet transform module configured to: perform wavelet transform decomposition on the standardized processed data, decompose into several layers, and obtain wavelet coefficients of each layer, and the wavelet coefficients include: low-frequency coefficients or high-frequency coefficients;

[0125] The noise reduction module is configured to: calculate the skewness coefficient and the kurtosis coefficient for the wavelet coefficient of each layer; judge whether the wavelet coefficient of the current layer conforms to the normal distribution accordin...

Embodiment 3

[0128] Embodiment 3. This embodiment also provides an electronic device, including a memory, a processor, and computer instructions stored in the memory and run on the processor. When the computer instructions are executed by the processor, the computer instructions in Embodiment 1 are completed. steps of the method described above.

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Abstract

The invention discloses an improved wavelet threshold denoising-based fault diagnosis method and an improved wavelet threshold denoising-based fault diagnosis system. The method comprises the steps ofobtaining to-be-diagnosed TE process data; standardizing the acquired data; carrying out wavelet transform decomposition on the standardized data, decomposing the data into a plurality of layers, andobtaining a wavelet coefficient of each layer; for the wavelet coefficient of each layer, calculating a skewness coefficient and a kurtosis coefficient; according to the skewness coefficient and thekurtosis coefficient of each layer, judging whether the wavelet coefficient of the current layer conforms to normal distribution or not is judged, and if yes, a hard threshold method is adopted for denoising; otherwise, denoising by adopting a soft threshold method; after denoising, obtaining a processed high-frequency coefficient and a processed low-frequency coefficient of each layer of waveletcoefficient, and reconstructing a data signal by using the processed high-frequency coefficient and the processed low-frequency coefficient to obtain denoised data; and analyzing the denoised data byutilizing a PCA model, and judging whether the TE process data to be diagnosed has fault data or not.

Description

technical field [0001] The present disclosure relates to the technical field of TE process fault diagnosis, in particular to a fault diagnosis method and system based on improved wavelet threshold denoising. Background technique [0002] The statements in this section merely mention background art related to the present disclosure and do not necessarily constitute prior art. [0003] Since the 21st century, with the rapid development of science and technology, modern industrial systems have become larger and more complex, and there is an urgent need to improve the safety and stability of the production process, so it is necessary to detect faults accurately and timely. The fault diagnosis method of multivariate statistics is generally adopted because it does not need to understand professional process knowledge and complex mathematical models, and only relies on collected industrial production process data. The principal component analysis method is a powerful technique for...

Claims

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Application Information

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IPC IPC(8): G06K9/00G06K9/62
CPCG06F2218/06G06F18/2135
Inventor 王新刚庄成文王柯
Owner QILU UNIV OF TECH
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