Patents
Literature
Patsnap Copilot is an intelligent assistant for R&D personnel, combined with Patent DNA, to facilitate innovative research.
Patsnap Copilot

162 results about "Process knowledge" patented technology

Knowledge processes are methods for creating, acquiring and using knowledge. This is a human-centered process as knowledge is information that exists as human thought. The term knowledge process is extremely broad and is commonly applied to knowledge-intensive business processes, training and events.

Method and device for acquiring knowledge graph vectoring expression

ActiveCN105824802ARich relevant informationSolve the problem of insufficient representation effect caused by sparsityNatural language data processingSpecial data processing applicationsStochastic gradient descentGraph spectra
The invention discloses a method and a device for acquiring knowledge graph vectoring expression. The method comprises the following steps of labeling an entity, existed in and belonging to a knowledge graph, in a given auxiliary text corpus by utilization of an entity labeling tool according to a to-be-processed knowledge graph so as to obtain an entity-labeled text corpus; constructing a co-occurrence network comprising words and entities on the basis of the text corpus so as to relate text information of the auxiliary text corpus to entity information of the knowledge graph, and then learning to obtain a text context embedded expression; respectively modeling the embedded expression of the entity and relation in the knowledge graph according to the text context embedded expression so as to obtain an embedded expression model of the knowledge graph; training the embedded expression model by utilization of a stochastic gradient descent algorithm so as to obtain the embedded expression of the entity and relation in the knowledge graph. The method and the device disclosed by the invention have the advantages that not only can the expression capability of the relation be improved, but also the problem of insufficient expression effect caused by sparseness of the knowledge graph can be effectively solved.
Owner:TSINGHUA UNIV

Parametric profiling using optical spectroscopic systems

A gallery of seed profiles is constructed and the initial parameter values associated with the profiles are selected using manufacturing process knowledge of semiconductor devices. Manufacturing process knowledge may also be used to select the best seed profile and the best set of initial parameter values as the starting point of an optimization process whereby data associated with parameter values of the profile predicted by a model is compared to measured data in order to arrive at values of the parameters. Film layers over or under the periodic structure may also be taken into account. Different radiation parameters such as the reflectivities Rs, Rp and ellipsometric parameters may be used in measuring the diffracting structures and the associated films. Some of the radiation parameters may be more sensitive to a change in the parameter value of the profile or of the films then other radiation parameters. One or more radiation parameters that are more sensitive to such changes may be selected in the above-described optimization process to arrive at a more accurate measurement. The above-described techniques may be supplied to a track/stepper and etcher to control the lithographic and etching processes in order to compensate for any errors in the profile parameters.
Owner:KLA TENCOR TECH CORP

Multi-process scheme planning method based on combination weighting method

The invention discloses a multi-process scheme planning method based on a combination weighting method. The multi-process scheme planning method comprises the following steps: analyzing various factors influencing the quality of a process scheme, and establishing two layers of evaluating systems; carrying out standardizing treatment on evaluating index data by adopting a subjection function; respectively weighting evaluating indexes by adopting a fuzzy integrated evaluating method and a variation coefficient method based on process knowledge data; in combination with the weighting results of the fuzzy integrated evaluating method and the variation coefficient method, taking minimal sum of weight error squares as a target function, and calculating combination weight by adopting a Lagrangian multiplier method; based on the combination weight, in combination with a gray relative analysis method, according to the design of two layers of evaluating structures, establishing two layers of gray relative analysis models, and selecting an optimal process scheme by correlation degree of candidate process schemes obtained by calculating the models. According to the multi-process scheme planning method disclosed by the invention, the distribution deviation of optimized target weights is reduced, and the performability of the process scheme is improved.
Owner:NORTHWESTERN POLYTECHNICAL UNIV

Semantic web based method for acquiring implicit relationship among steel iron making process knowledge

The invention relates to a semantic web based method for acquiring an implicit relationship among steel iron making process knowledge. The method is used for accurately expressing the implicit relationship among the steel iron making process knowledge. The method comprises the following steps of 1) performing triple expression on the steel iron making process knowledge to establish an initialized model of a concept and the relationship of the steel iron making process knowledge; 2) converting the initialized model to construct an ontology base; 3) performing semantic mapping on production standard data and the ontology base to construct a semantic web model; 4) performing formalized expression on a constraint condition of the concept and the relationship in the steel iron making process knowledge by adopting a semantic web rule language (SWRL) to establish a knowledge reasoning-oriented rule base; and 5) according to the semantic web model and the rule base, obtaining implicit associated information of the steel iron making process knowledge. Compared with the prior art, the method has the advantages of reusability, easiness for maintenance, flexibility for expression, fullness for discovery, strong data correlation and the like.
Owner:TONGJI UNIV

Fault prediction method based on joint relative change analysis and autoregression model

The invention discloses a fault prediction method based on joint relative change analysis and autoregression modeling. According to the method, on the basis of principal component analysis, the fault influences are decomposed based on a joint relative change analysis method, and the fault direction is determined; then the fault amplitude is evaluated based on a reconstruction technology according o the determined fault direction, and data recovery of the normal portion is conducted; new monitoring statistical magnitude D<2> covering the normal data fluctuation is defined, and accordingly the event alarm limit (please see the formula in the specification) is established; finally an autoregression model is established based on the new monitoring statistical magnitude D<2> to be used for predicting the on-line monitoring statistical magnitude, and alarming in advance of the fault is achieved. The fault prediction method is easy and convenient to implement, efficient and free of depending on prior process knowledge and hypothesis. The fault prediction result is significant to subsequent fault diagnosis and repair, process engineers judge the process operation state timely and easily, and thus safe and reliable industrial production and pursuit for high-quality products are guaranteed.
Owner:ZHEJIANG UNIV

Method for knowledge extraction and evolution in machine parts processing technological procedure

The present invention provides a method for knowledge extraction and evolution in a machine parts processing technological procedure. The method comprises: building a machine parts information description model, arranging corresponding technological procedure data, and uniformly expressing the model and the data by adopting an XML technology; establishing a snowflake model process case base, and mapping the data in XML into a corresponding table; establishing a data mining system to perform clustering according process names and extract common process words in the technological procedure; complementing the first clustering of parts process cases according to parts information, performing clustering according to a technological route, extracting a typical process sequence and a typical structure process in the technological procedure, and recommending a typical process template; reusing process knowledge in the common process words, the process sequence, the typical structure process and the typical process template based on a case reasoning technology and by means of a part structure decomposition policy and a smart prompting technology; and establishing a memory and forgetting model for realizing evolution and essence extraction of the process knowledge. According to the method provided by the present invention, the reuse of the process knowledge in different granularity levels and the standardization of the process design are achieved.
Owner:TIANJIN UNIV

Numerical control system and control method for achieving automatic optimization of tool paths based on DBF

The invention relates to a numerical control system and a control method for achieving automatic optimization of tool paths based on DBF, and belongs to the technical field of numerical control system control. The numerical control system comprises a file information read module, a graphic primitive information analysis module and an NC code generation module. The control method includes that after DBF graphic files are read by the file information read module, graphs in the DBF graphic files are divided by the graphics primitive information analysis module according to a preset graphic primitive, and at last, NC codes are generated by the NC code generation module according to divided graphs. By adoption of the numerical control system and the control method, graphic information can be extracted from CAD graphs and converted to coordinate point data, combined with numerical control machining technique knowledge, the data are converted to the NC codes which can be identified by a machine tool to generate a numerical control program and achieve control of numerical control system machining, moreover according to the numerical control system and the control method for achieving the automatic optimization of the tool paths based on the DBF, the implementation mode is easy and convenient, implementation cost is low, and the application range is relatively wide.
Owner:SHANGHAI WEIHONG ELECTRONICS TECH

A method and apparatus for processing knowledge map based on semi-supervised embedded representation model

The invention discloses a knowledge map processing method and a device based on a semi-supervised embedded representation model, the method comprises calculating a first-order proximity and a second-order proximity of a knowledge map, calculating the supervisory loss of the first-order proximity and the supervisory loss of the second-order proximity, establishing a linear combination of the supervisory loss of the first-order proximity and the supervisory loss of the second-order proximity, optimizing the knowledge map under the condition of minimizing the linear combination, and the like. Bycalculating the first-order proximity between any two vertices in the knowledge map, and calculating the second-order proximity according to the neighborhood structure of any two vertices in the knowledge map, At the same time, the first-order proximity and the second-order proximity are considered to jointly optimize the knowledge map so as to retain the local and global structural information ofthe knowledge map, thereby overcoming the defects caused by the dependence of the knowledge map on the characteristics of each vertex and the lack of the relationship information among the vertices in the prior art. The invention is widely applied to the field of image recognition.
Owner:SOUTH CHINA NORMAL UNIVERSITY

Multilayer numerical control programming method for flexible hole formation on large-scale wing part

The invention relates to a multilayer numerical control programming method for flexible hole formation on a large-scale wing part. The multilayer numerical control programming method includes the steps as follows: (1) reading part and blank documents; (2) adding missing features, that is, generating needed hole position information in a digital model; (3) extracting related information in a machine tool parameter library and a cutter parameter library, performing definition of machining preparation parameters, that is, setting machine tool parameters, setting a machining coordinate system and setting other auxiliary parameters; (4) extracting related information in a technological parameter library and a cutting parameter library, performing geometrical characteristic recognition and related parameter setting, namely, machining path planning and parameter setting; (5) extracting related information in a technological knowledge library, and performing cutter path generation and simulation verification; (6) generating a cutter path document; and (7) postprocessing. The system is used in the process of flexible hole formation on a wing, can finish skin and rib drilling and dimple programming work in one step, effectively improves the programming efficiency, and meanwhile improves the auxiliary hole position precision.
Owner:SHENYANG AIRCRAFT CORP

Traditional Chinese medicine production process knowledge system

The invention discloses a traditional Chinese medicine production process knowledge system which comprises a database module, a competency assessment module, a monitoring feedback module and a designspace looking-for module. The database module comprises a production data collection unit and a storage unit, the production data collection unit is used for collecting process parameter data in production, process parameters include quality data and process data, and the storage unit is used for storing the collected process parameter data; the competency assessment module is used for assessing system process capability according to the quality data to acquire process capability assessment results; the monitoring feedback module is used for entering a whole-process monitoring mode when the process capability assessment results are responded adequately; the design space looking-for module is used for entering a design space looking-for module according to the process data when the processcapability assessment results are responded inadequately. The parameters are released or design space is looked for through the process capability assessment, so that the production process knowledgesystem is allowed to gradually returns to the process knowledge system with the traditional Chinese medicine production process adjusted and fed back intelligently.
Owner:JIANGSU KANION PHARMA CO LTD +1

Semiconductor process monitoring method based on independent component analysis and Bayesian inference

The invention discloses a semiconductor process monitoring method based on independent component analysis and Bayesian inference, comprising the following step of: firstly, dividing working conditions according to the mixed data of the semiconductor process, conducting the independent component analysis for each working condition data, and establishing a corresponding independent component analysis model; and then integrating and combining the monitoring information under the different working conditions by a Bayesian inference method to obtain a final monitoring result. In addition, the invention can also acquire the working condition information of current monitoring data by a posterior probability analysis method, that is to say, the invention can judge that the current monitoring data is in what process operation working condition; compared with the present other methods, the invention can not only greatly enhance the monitoring effect of the semiconductor process, but also largely improve the dependence of the monitoring method on process knowledge and enhance the comprehensive ability and the operating confidence of process operators on the process, thereby being more beneficial to the implementation of the automation of the semiconductor process.
Owner:ZHEJIANG UNIV

Parametric Profiling Using Optical Spectroscopic Systems

A gallery of seed profiles is constructed and the initial parameter values associated with the profiles are selected using manufacturing process knowledge of semiconductor devices. Manufacturing process knowledge may also be used to select the best seed profile and the best set of initial parameter values as the starting point of an optimization process whereby data associated with parameter values of the profile predicted by a model is compared to measured data in order to arrive at values of the parameters. Film layers over or under the periodic structure may also be taken into account. Different radiation parameters such as the reflectivities Rs, Rp and ellipsometric parameters may be used in measuring the diffracting structures and the associated films. Some of the radiation parameters may be more sensitive to a change in the parameter value of the profile or of the films then other radiation parameters. One or more radiation parameters that are more sensitive to such changes may be selected in the above-described optimization process to arrive at a more accurate measurement. The above-described techniques may be supplied to a track / stepper and etcher to control the lithographic and etching processes in order to compensate for any errors in the profile parameters.
Owner:KLA CORP

Automobile covering part sheet metal forming technology optimizing method based on STL grid feature recognition

ActiveCN106599515ASolve complex analysis problemsReduce stamping process design timeGeometric CADDesign optimisation/simulationProcess knowledgeDecision-making
The invention discloses an automobile covering part sheet metal forming technology optimizing method based on STL grid feature recognition. The method comprises the following steps: firstly reading a part STL grid model to obtain part curve information, obtaining part shape features through the curve information, constructing a part feature tree according to a feature topological relation, classifying the features according to feature processing categories, and determining respective sheet metal forming technology for different features. According to the method, a process knowledge database is taken as a core, optimization for the part sheet metal forming technology is finally completed depending on the obtained feature tree and the sheet metal forming technology route of each feature parameter decision-making part under the mechanism support of knowledge reasoning, the features can be extracted from the automobile covering part sheet STL model automatically, and the sheet metal forming technology routes are designed, so that a large amount of repeated work of technologists can be reduced, the work efficiency is effectively improved, and the technology preparation time is shortened.
Owner:WUHAN UNIV OF TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products