Superlattice phase change thin film with low density change, phase change memory and preparation method thereof

一种相变存储器、密度变化的技术,应用在电气元件等方向,能够解决两态密度变化大、空洞、器件失效等问题

Active Publication Date: 2021-09-14
HUAZHONG UNIV OF SCI & TECH
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Problems solved by technology

At present, the two types of phase change layer materials in superlattice phase change materials also have the characteristics of large changes in the two-state density, resulting in "voids" in the process of repeated erasing and writing. Therefore, superlattice phase change materials still have multiple cycles of erasure. The problem of device failure after writing

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  • Superlattice phase change thin film with low density change, phase change memory and preparation method thereof
  • Superlattice phase change thin film with low density change, phase change memory and preparation method thereof
  • Superlattice phase change thin film with low density change, phase change memory and preparation method thereof

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preparation example Construction

[0055] First, preparation of two phase change layer may be deposited by magnetron sputtering, atomic layer deposition method, molecular beam epitaxy, pulsed laser deposition, physical vapor deposition, chemical vapor deposition, thermal evaporation or electrochemical growth process either in.

[0056] The present embodiment further provides a phase change memory, phase change memory including the above-described superlattice phase-change film, further comprising upper and lower electrodes, a superlattice phase-change film disposed on the electrode, between the lower electrode, comprising alternating the first and second phase change layer stack, and the second phase change layer having a negative anomalous density change rate in the crystallization process. The density of the negative change layer during crystallization and amorphization, the volume change compared to the ordinary phase change material layer having an opposite tendency. Thus both the superlattices are stacked to f...

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Abstract

The invention discloses a superlattice phase change film with low density change, a phase change memory and a preparation method. The superlattice phase change film comprises a first phase change layer and a second phase change layer which are alternately stacked to form a periodic structure ; During the crystallization process, the first phase change layer has a conventional positive density change, while the second phase change layer has an abnormal negative density change, so its density during the crystallization process is abnormally reduced and the volume increases, It can be used to counteract the volume reduction phenomenon of the first phase change layer during the crystallization process; the superlattice film formed by alternately stacking conventional phase change materials and materials with negative density changes can reduce the phase change memory material during the phase change process. The volume change of the phase change memory material can reduce the voids caused by the repeated increase and decrease of the volume of the phase change memory material during the cycle of erasing and writing; The stability of cyclic erasing and writing of the phase change memory device is significantly increased, and the service life of the device is improved.

Description

Technical field [0001] The present invention belongs to the technical field of microelectronic devices and memory, and more particularly, to a density variation of a superlattice phase-change film, a phase change memory and its preparation method. Background technique [0002] Since the phase change memory material which can achieve rapid reversible change between the crystalline state (low resistance state) and an amorphous (high resistance state) by applying an electrical or optical pulses much attention as a high impedance transformation process SET resistance state is referred to the process, which is the reverse process is called RESET process. Technology-based storage phase change material is believed to be a strong contender for one of the next-generation storage technology. [0003] Two-state phase change material having a different mass density, in general, since the crystalline state of ordering a higher atomic density, smaller. Due to its amorphous disordered atomic di...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H01L45/00
CPCH10N70/841H10N70/023H10N70/231H10N70/8828H10N70/8413H10N70/826H10B63/00H10N70/8613
Inventor 程晓敏冯金龙徐明徐萌缪向水
Owner HUAZHONG UNIV OF SCI & TECH
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