Device, system and method for full-band signal quality detection of microwave chip

A microwave chip and signal quality technology, applied in the direction of measuring devices, measuring electricity, measuring electrical variables, etc., to achieve the effect of removing parasitic parameters, reducing signal transmission loss, and reducing the effect of modulation

Pending Publication Date: 2020-04-10
BEIJING ZHENXING METROLOGY & TEST INST
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0010] In view of the above analysis, the present invention aims to provide a device, system and method for detecting the quality o

Method used

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  • Device, system and method for full-band signal quality detection of microwave chip
  • Device, system and method for full-band signal quality detection of microwave chip
  • Device, system and method for full-band signal quality detection of microwave chip

Examples

Experimental program
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Effect test

Embodiment 1

[0046] A specific embodiment of the present invention discloses a device for microwave chip full-band signal quality detection, such as figure 1 As shown, including test fixture, microwave input port, microwave output port, control unit, power supply unit and test substrate;

[0047] The test substrate is a printed circuit board with a size of 8×8cm to 12×12cm, small in size and easy to install; the test fixture, microwave input port, microwave output port, control unit and power supply unit are integrated into the test unit by welding On the substrate, it is convenient for debugging.

[0048] The test fixture is used to non-destructively install the microwave chip to be tested; specifically, it includes a test socket and an upper cover, and the test socket includes pogo pins corresponding to the pads of the chip to be tested; the chip to be tested is in accordance with Put it into the test socket in the correct direction, and the upper cover plate is covered with the test so...

Embodiment 2

[0079] A specific embodiment of the present invention discloses a system for microwave chip full-band signal quality detection, such as figure 2 As shown, it includes a DC stabilized power supply, a microwave signal source, a spectrum analyzer, a host computer and a signal quality detection device as described in Embodiment 1;

[0080] The DC stabilized power supply, microwave signal source, spectrum analyzer, and host computer are respectively connected to the signal quality detection device, and as described in Embodiment 1, the microwave chip to be tested is non-destructively installed on the signal quality detection device. Frequency band signal quality detection.

[0081] Specifically, the host computer is connected to the microwave signal source, and is used to control the microwave signal source to output a microwave reference signal to the signal quality detection device;

[0082] Preferably, a USB interface of the host computer is connected to the GPIB communication...

Embodiment 3

[0088] A specific embodiment of the present invention discloses a method for detecting the signal quality of a microwave chip full frequency band, such as image 3 shown, including the following steps:

[0089] Step S1, connect the full-band signal quality detection system as described in the second embodiment, put the microwave chip to be tested into the test fixture in the correct direction; batch testing can be realized by using the test fixture.

[0090] Step S2, the system is powered on and starts to detect;

[0091] Step S3, generating a frequency control word covering the full-band signal of the microwave chip, and controlling the corresponding output frequency of the microwave chip to be tested;

[0092] Preferably, the switch command can be generated by the switch component of the signal quality detection device to control the control unit to generate a frequency control word covering all frequency band signals of the microwave chip.

[0093] Preferably, the host co...

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Abstract

The invention relates to a device, a system and a method for the full-band signal quality detection of a microwave chip, belongs to the technical field of chip testing, and solves the problem of nondestructive testing of the microwave chip. The device comprises a test harness, a microwave input port, a microwave output port and a control unit, wherein the test harness is used for lossless installation of a microwave chip to be tested; the microwave input port is externally connected with a microwave signal source and is used for providing a reference signal source for the microwave chip to betested; the microwave output port is externally connected with a spectrum analyzer and is used for outputting microwave signals generated by the microwave chip to be tested to the spectrum analyzer for signal analysis; the control unit comprises at least one control input port and is used for receiving a control instruction, generating a frequency control word covering the full frequency band of the microwave chip and controlling the microwave chip to be tested to output a microwave signal with a corresponding frequency. The device is low in manufacturing cost and simple in structure; and thetest process is simple and convenient and is suitable for batch test.

Description

technical field [0001] The invention relates to the technical field of chip testing, in particular to a device, system and method for detecting the quality of microwave chip full-band signals. Background technique [0002] The current microwave devices have complex functions, small packages, and many pins. Testing their functions and performance before they are put into use can fully eliminate early failure products and reduce hidden dangers for the formal use of the devices. [0003] Existing devices for microwave device detection have the following limitations: [0004] (1) Only devices with simple pins can be tested, and complex pins, especially chips that require external control, are difficult to test; [0005] (2) It can only be tested at a single frequency point, or the frequency can be changed through reconfiguration of the control unit. The test process is complicated, the test frequency point is limited by factors such as cumbersome download procedures, and the te...

Claims

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Application Information

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IPC IPC(8): G01R31/28
CPCG01R31/2851
Inventor 邱少军于孟国王晶王惠赵娜杨盼
Owner BEIJING ZHENXING METROLOGY & TEST INST
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