Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Method and system for selecting single event locking effect protection resistor

A technology of single-event locking and protective resistance, which is applied in the direction of measuring electricity, measuring electrical variables, measuring interference from external sources, etc., to achieve the effect of ensuring safety and reliability and reducing radiation risks

Active Publication Date: 2020-04-14
CHINA ACADEMY OF SPACE TECHNOLOGY
View PDF5 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The technical problem solved by the present invention is to overcome the deficiencies of the prior art, provide a method and system for selecting a single event lock-in protective resistor, and solve the problem of how to select the series resistance value when protecting a single event lock-in sensitive circuit or device. Determine the problem, and give the technical conditions and requirements for resistor selection

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Method and system for selecting single event locking effect protection resistor
  • Method and system for selecting single event locking effect protection resistor
  • Method and system for selecting single event locking effect protection resistor

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0040]In order to solve the problem that it is difficult to determine the resistance value of the single event lock-up protection resistance in the space application of COTS devices or more sensitive components of single event lock-up. The single particle locking test of the device to be protected is used in the present invention to provide the single particle locking sensitivity and locking current; at the same time, combined with the recommended operating electrical performance parameters in the manual of the device to be protected, the range of operating voltage is given, combined with the device to be protected In the application conditions (in the system), the working voltage and working current under the actual working conditions are given; through the basis algorithm for the selection of resistances under different conditions, the range of the resistance value of the series resistors is obtained, combined with practical applications and availability , and finally select ...

Embodiment 2

[0060] Test device selection

[0061] TLV5638MDREP is a dual-channel 12-bit DAC converter produced by TI, and its anti-single event lock-up LET threshold is between 21.8MeV.cm 2 / mg and 37.2MeV.cm 2 Between / mg, the device lock-up is more sensitive, and it is necessary to take anti-single event lock-up measures according to the critical situation of the model application.

[0062] Circuit description of the series resistance of the object to be protected

[0063] Since the TLV5638MDREP device has a single event lock, the +5V power supply current will increase abnormally, but since it can be restored after power-off, it can be guaranteed that the current passing through the device is very small in the case of using a current-limiting resistor, so that the device Locking does not occur when the locking current cannot be reached, and even if a single event locking phenomenon occurs, the product can still recover its function by powering off and on again, so as to ensure that th...

Embodiment 3

[0079] The invention discloses a selection system for single event lock-in protection resistance, which includes: a data acquisition module, which is used to give the lock-in current value I according to the obtained single-event lock-in effect electrical parameter test results SEL; Analyze the normal working electrical performance conditions of the object to be protected, and determine the normal operating voltage value V of the object to be protected under working conditions CC , normal working current value I CC , and the data range of the supply voltage value during normal operation V min ~V max ; The data solution module is used for locking the current value I according to SEL and the normal operating voltage value V CC , determine the minimum value R of the series resistance of the object to be protected min ;According to the normal operating current value I CC and the minimum supply voltage value V min , determine the maximum value R of the series resistance of th...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a method and system for selecting a single event locking effect protection resistor, and the method comprises the steps: giving a locking current value according to an obtainedsingle event locking effect electrical parameter test result of a to-be-protected object; analyzing normal working electrical performance conditions of the to-be-protected object, and determining a normal working voltage value and a normal working current value of the to-be-protected object under the working condition, and a power supply voltage value data range during normal working; determininga minimum value of a series resistor of the to-be-protected object according to the locking current value and the normal working voltage value; determining a maximum value of the series resistor of the to-be-protected object according to the normal working current value and the minimum power supply voltage value; and determining a selection result of the series resistor of the to-be-protected object according to the determined minimum value and maximum value of the series resistor of the to-be-protected object. According to the invention, the protection problem of single event locked sensitive devices such as COTS devices and the like in space application can be solved.

Description

technical field [0001] The invention relates to the field of anti-radiation technology of components, in particular to a method and system for selecting a single event lock-in effect protective resistor. Background technique [0002] With the rapid development of satellite technology, the supply of high-grade components has gradually been unable to meet the needs of growing space missions due to factors such as cost, procurement cycle and performance. Commercial off-the-shelf (COTS: Commercial off-the-shelf) technology is more and more widely used in satellite technology because of its advantages of high performance, short delivery time, and low cost. However, the radiation resistance of space applications is not considered in the development of COTS devices. Therefore, it is necessary to take anti-radiation hardening measures for the space application of COTS devices to reduce the application risk caused by radiation effects. [0003] Single event lock-up (SEL: Single Eve...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/00
CPCG01R31/001G01R31/002
Inventor 李鹏伟张洪伟李勇张宇飞赵亚飞吕贺梅博李晓亮
Owner CHINA ACADEMY OF SPACE TECHNOLOGY
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com