A 3D measurement method based on random two-frame phase-shifted fringe patterns
A three-dimensional measurement and fringe pattern technology, which is applied to measurement devices, details of 3D image data, image enhancement, etc., can solve the problems of non-negligible time interval, phase measurement error, uneven phase shift, etc., and achieves reconstruction accuracy. Not high, reduce the number of streak frames, and improve the effect of reconstruction accuracy
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Embodiment 1
[0069] Please refer to figure 1 and figure 2 , figure 1 is a schematic structural diagram of a three-dimensional measurement system provided by an embodiment of the present invention, figure 2 It is the measurement schematic diagram of the three-dimensional measurement system provided by the embodiment of the present invention. As shown in the figure, the measurement principle of the three-dimensional measurement system is to use a projector to project stripes onto the surface of the object to be measured. The change in the shape of the object to be measured causes the stripes to be deformed. The phase information of the object is extracted, and the three-dimensional shape information of the object is obtained according to the phase-height mapping relation.
[0070] See image 3 , image 3 It is a flowchart of a three-dimensional measurement method based on a random two-frame phase-shift fringe pattern provided by an embodiment of the present invention. As shown in the ...
Embodiment 2
[0123] This embodiment is a comparison and simulation test of the three-dimensional measurement method based on random two-frame phase-shift fringe diagrams, the four-step phase-shift method, and the Fourier profilometry measurement method of Embodiment 1, to illustrate that the method of the present invention has a higher robustness and precision.
[0124]The reference phase provided by this embodiment is Its size is 801×801, see Figure 4 and Figure 5 , Figure 4 and Figure 5 is a reference phase diagram provided by the embodiment of the present invention, where Figure 4 is the phase diagram of the reference phase, Figure 5 is a top view of the reference phase.
[0125] In this embodiment, in order to verify the effectiveness and robustness of the method of the present invention, the background intensity and the amplitude of the modulation degree of the first fringe pattern and the second fringe pattern are set to vary unevenly, wherein the The background intensi...
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