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Light intensity correction method for Fourier laminated microscopic imaging technology

A technology of Fourier stacking and microscopic imaging, which is applied in microscopes, image enhancement, optics, etc., can solve problems such as uneven illumination errors, differences in resistance, and different light intensities, and achieve the correction of inconsistency in light intensity errors Effect

Active Publication Date: 2020-04-24
BEIJING INSTITUTE OF TECHNOLOGYGY
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  • Application Information

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Problems solved by technology

[0004] However, there are many types of uneven illumination in the current system. The sources of error include: the current flowing through the LED lamp is unstable, the resistance of different LED lamp beads is different, and the heat dissipation function of some LED lamps decreases with the use of time. Attenuation, etc.
These will lead to different light intensities of incident light reaching the sample surface at different angles, resulting in poor quality of reconstructed high-resolution images
[0005] The current method to solve the above problems is mainly to compensate from the algorithm. Generally, the purpose of error correction is achieved by reducing the amplitude difference between the measured image and the target complex amplitude image or the amplitude difference between the two. However, when the collected original image has a large When there is a large degree of uneven illumination error or nonlinear error in the sub-spectrum during reconstruction, many correction methods cannot achieve a good correction effect

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  • Light intensity correction method for Fourier laminated microscopic imaging technology
  • Light intensity correction method for Fourier laminated microscopic imaging technology
  • Light intensity correction method for Fourier laminated microscopic imaging technology

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Embodiment 1

[0040]Due to the instability of the current flowing through the LED lamp in the system, the difference in the resistance of different LED lamp beads, as the use time becomes longer, the heat dissipation function of some LED lamps will decline, and errors such as brightness attenuation will cause the light intensity reaching the surface of the sample. The error of inconsistent size can be effectively corrected by using the light intensity correction method that can be used in Fourier stack microscopic imaging technology. The light source used in this embodiment is an LED array. The size of the LED array participating in the illumination is 31×31, the distance between the LED lights is 2.5mm, the distance between the LED array and the sample is 96mm, the wavelength of the illumination light is 630nm, the numerical aperture of the objective lens is 0.09, and the image acquisition device is a CCD camera. The element size is 2.45 μm. LED lamps at different positions on the LED arr...

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Abstract

The invention discloses a light intensity correction method for a Fourier laminated microscopic imaging technology, and the method can achieve the effect of image brightness correction, and achieves apurpose of correcting a light intensity inconsistency error. The method comprises the following steps: (1) collecting an original image to form an image data set; (2) setting an image intensity multiple change interval [A, B], setting an intensity correction coefficient initial value corresponding to the acquired original image as 1, converting an intensity correction coefficient value, and adjusting the intensity of the image; sequentially changing the initial image intensity correction coefficient values according to the values in the interval [A, B] and t, multiplying each measured image by different intensity correction coefficients, and calculating an evaluation function once after each change; finding the most appropriate brightness multiple value through a plurality of iterations;(3) adjusting each low-resolution image according to the most appropriate brightness multiple value to finish the brightness correction of the image; and (4) performing high-resolution reconstructionon the corrected image to obtain a reconstructed image.

Description

technical field [0001] The invention relates to the technical field of microscopic imaging, in particular to a method for correcting light intensity used in Fourier laminated microscopic imaging technology. Background technique [0002] Microscopic imaging technology is a technology that uses optical systems or electronic equipment to observe the morphological structure and characteristics of tiny objects. Fourier laminated microscopic imaging technology (FPM) can break through the limitation of the numerical aperture of the objective lens of the imaging system through computational reconstruction. , while realizing large field of view and super-resolution imaging, it is widely used in cytology, biology, medicine and other fields. [0003] According to the current research, FPM uses the illumination light with the same illumination brightness to provide plane waves at different angles and illuminate the sample separately. Ideally, the light intensity of the illumination ligh...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06T5/00G06T3/40G02B21/36
CPCG06T3/4007G02B21/365G06T2207/10056G06T2207/20056G06T5/90
Inventor 张韶辉郝群王影胡摇
Owner BEIJING INSTITUTE OF TECHNOLOGYGY