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Method for Calculating Dislocation Density of Deformed Crystal Materials Based on Single Diffraction Peaks

A technology for crystal materials and diffraction peaks, applied in the field of X-ray diffraction peak analysis, can solve problems such as time-consuming and stressful, and achieve the effect of saving time and shortening the time-consuming of experiments.

Active Publication Date: 2021-02-26
XI AN JIAOTONG UNIV
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Problems solved by technology

In view of the fact that the experimental machine of the synchrotron radiation source is very tight, it is a time-consuming solution to collect the signals of many diffraction peaks through energy scanning, especially when it is necessary to study the dislocation density at different positions of the deformed crystal material, the disadvantages are more prominent

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  • Method for Calculating Dislocation Density of Deformed Crystal Materials Based on Single Diffraction Peaks
  • Method for Calculating Dislocation Density of Deformed Crystal Materials Based on Single Diffraction Peaks
  • Method for Calculating Dislocation Density of Deformed Crystal Materials Based on Single Diffraction Peaks

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[0055] The following will refer to the attached Figure 1 to Figure 5 Specific embodiments of the present disclosure are described in detail. Although specific embodiments of the present disclosure are shown in the drawings, it should be understood that the present disclosure may be embodied in various forms and should not be limited to the embodiments set forth herein. Rather, these embodiments are provided for more thorough understanding of the present disclosure and to fully convey the scope of the present disclosure to those skilled in the art.

[0056] In one embodiment, such as figure 1 As shown, the present disclosure provides a method for calculating the dislocation density of a deformed crystal material based on a single diffraction peak, comprising the following steps:

[0057] S100: Using synchrotron radiation energy scanning X-ray diffraction technology, respectively obtain the experimental intensity distribution curve I(Q) of the diffraction intensity of the def...

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Abstract

The invention discloses a method for calculating dislocation density of a deformed crystal material based on a single diffraction peak. The method comprises the following steps of: utilizing a synchrotron radiation energy scanning X-ray diffraction technology to obtain an experimental intensity distribution curve of diffraction intensity of the deformed crystal material relative to a diffraction vector mode and a reference intensity distribution curve of diffraction intensity of a non-deformed crystal material relative to the diffraction vector mode; introducing a dimensionless variable M, andcalculating a standard intensity distribution curve of a diffraction peak after dislocation density normalization; calculating a specific M value of the experiment intensity distribution curve according to the experiment intensity distribution curve and the standard intensity distribution curve, and recording the specific M value as M'; and calculating the dislocation density of the deformed crystal material according to the full widths at half maximum of the experimental intensity distribution curve, the standard intensity distribution curve and the reference intensity distribution curve. The dislocation density of the deformed crystal material can be obtained by analyzing the intensity distribution curve of the single diffraction peak, and the experiment time is shortened.

Description

technical field [0001] The disclosure belongs to X-ray diffraction peak analysis technology, in particular to a method for calculating the dislocation density of a deformed crystal material based on a single diffraction peak. Background technique [0002] As an efficient characterization method, synchrotron radiation X-ray diffraction is widely used to study the microstructure of various crystal materials. The traditional method of measuring the local strain and defect density of materials is synchrotron radiation monochromatic X-ray diffraction. During the measurement, the sample needs to be continuously tilted in two dimensions with small steps. high. As a new technology, synchrotron radiation energy scanning X-ray diffraction continuously changes the energy of incident X-rays during the measurement. The experimental process does not require tilting the sample, so the requirements for the experimental device and sample preparation are simpler. By analyzing the energy sca...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N23/2055G01N23/207
CPCG01N23/2055G01N23/2076G01N2223/056G01N2223/1016G01N2223/203G01N2223/401G01N2223/607G01N2223/6462
Inventor 陈凯周光妮张玉彬朱文欣
Owner XI AN JIAOTONG UNIV
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