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Built-in self-test method and system for Ethernet controller transceiving path

A built-in self-test and controller technology, applied in the field of integrated circuits, can solve the problems of difficult data protocol analysis and high complexity of test stimulus generation, reducing design complexity, improving test efficiency, and reducing complexity and cost. Effect

Active Publication Date: 2020-06-02
XIAN MICROELECTRONICS TECH INST
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Problems solved by technology

[0006] The technical problem to be solved by the present invention is to provide a built-in self-test method and system oriented to the transceiver channel of the Ethernet controller for the deficiencies in the above-mentioned prior art , effectively solve the problems of high-bandwidth Ethernet controller chip test and aging process, such as high complexity of test stimulus generation and difficulty in data protocol analysis. Stage process improves test efficiency, reduces test cost, does not occupy additional chip pins, and maintains compatibility with chip pin definitions

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  • Built-in self-test method and system for Ethernet controller transceiving path
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  • Built-in self-test method and system for Ethernet controller transceiving path

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Embodiment Construction

[0038] The present invention provides a built-in self-test method for the transceiver path of the Ethernet controller, adopts the concept of on-chip loopback, and constructs a path for data to wrap around from the sending path to the receiving path; the test stimulus is generated inside the controller and the result is analyzed. Compare and analyze to determine whether the core functions of the controller and the transmission and reception channels are operating normally, and automatically locate when a fault occurs; at the same time, the pin multiplexing method is used to realize flexible configuration and output of test modes and test results.

[0039] see figure 1 , the present invention is a kind of built-in self-test method facing Ethernet controller transceiver path, comprising the following steps:

[0040] S1, first analyze the test mode according to the test mode selection method, and judge whether the configuration of the test mode meets the requirements of the test m...

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Abstract

The invention discloses a built-in self-test method and a built-in self-test system for an Ethernet controller transceiving path, and the method comprises the steps: adopting the concept of on-chip loopback to construct a path in which data is rewound from a transmitting path to a receiving path; generating a test excitation in a controller, comparing and analyzing the results, determining whetherthe core function of the controller and a transceiving access operate normally or not, and performing automatic positioning when a fault occurs; employing a pin multiplexing mode , so flexible configuration and output of a test mode and the test results are realized.

Description

technical field [0001] The invention belongs to the technical field of integrated circuits, and in particular relates to a built-in self-test method and system oriented to the transceiver channel of an Ethernet controller, and is especially suitable for applications where the number of controller pins and hardware resources are limited, the interface protocol is complex, and the electrical characteristics are required. Higher chips, such as low-power embedded Gigabit Ethernet controllers, 10 Gigabit Ethernet controllers, etc. Background technique [0002] Currently, in mainstream Ethernet controllers, the interface bandwidth usually reaches or exceeds 1000 Mbps. In other words, Gigabit and higher bandwidth Ethernet controllers account for the vast majority of the market. In fact, the current maximum bandwidth of Ethernet can reach 100Gbps, and the next-generation 400Gbps standard is also being formulated. [0003] However, the ever-increasing network interface bandwidth ha...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/22
CPCG06F11/2205G06F11/2273G06F11/2268
Inventor 李龙飞冯海强尹堉洲楚亚楠李童王剑峰
Owner XIAN MICROELECTRONICS TECH INST
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