Supercharge Your Innovation With Domain-Expert AI Agents!

Chip detection equipment

A chip detection and equipment technology, applied in the measurement of electricity, measurement devices, measurement of electrical variables, etc., can solve problems such as slow efficiency, and achieve the effect of improving recognition efficiency, improving detection efficiency, and preventing excessive rotation speed.

Inactive Publication Date: 2020-06-23
湖州靖源信息技术有限公司
View PDF0 Cites 2 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] In order to ensure the yield rate of the chips shipped out of the factory, the chips will be inspected in the final process of chip manufacturing. The existing inspection requires manual inspection, and the efficiency is relatively slow.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Chip detection equipment
  • Chip detection equipment
  • Chip detection equipment

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0022] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0023] see Figure 1-5 , the present invention provides a technical solution: a chip testing device, including a base plate 1, the bottom of the base plate 1 is fixedly connected with a support leg 2, the shape of the base plate 1 is "L", and the support legs 2 at the bottom of the base plate 1 are provided with Six, the bottoms of the six supporting legs 2 are fixedly connected with supporting feet, the six supporting feet are made of rubber, the right side o...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses chip detection equipment including a bottom plate, supporting legs are fixedly connected to the bottom of the bottom plate. The right side of the upper surface of the bottom plate is fixedly connected with a conveying groove. Supporting frames are fixedly connected to the two ends of the bottom of the inner wall of the conveying groove. Guide rollers are arranged at the tops of the two support frames; first rotating shafts are fixedly connected to the two ends of the two guide rollers, first bearings are fixedly connected to the two ends of the two guide rollers and located at the top of the supporting frame, the first rotating shafts are movably connected with the first bearings, the first rotating shaft at one end of one guide roller penetrates through the left end of the supporting frame to be fixedly connected with a first belt wheel, and a first motor is fixedly connected to the upper surface of the conveying groove. The chips are recognized through the camera, the chips with the shapes not meeting the specifications are screened out, the chips are grabbed up through the grabbing mechanism and then moved through the second sliding block, the chips are installed on the test mainboard to be subjected to the power-on test, and therefore manpower is omitted, and the detection efficiency is greatly improved.

Description

technical field [0001] The invention relates to the technical field of chip detection, in particular to a chip detection device. Background technique [0002] Integrated circuit English: integrated circuit, abbreviated as IC; or microcircuit (microcircuit), microchip (microchip), chip / chip (chip) is a kind of circuit in electronics (mainly including semiconductor equipment, including passive components) etc.) miniaturization, and is often manufactured on the surface of semiconductor wafers. After the invention and mass production of transistors, various solid-state semiconductor components such as diodes and transistors have been used in large quantities, replacing the functions and roles of vacuum tubes in circuits. In the middle and late 20th century, the progress of semiconductor manufacturing technology made integrated circuits possible. Compared with hand-assembled circuits using individual discrete electronic components, integrated circuits can integrate a large numbe...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G01R31/28G01R31/01G01R1/04G01B11/24
CPCG01B11/24G01R1/0425G01R31/01G01R31/2808G01R31/2886G01R31/2893
Inventor 王淑琴
Owner 湖州靖源信息技术有限公司
Features
  • R&D
  • Intellectual Property
  • Life Sciences
  • Materials
  • Tech Scout
Why Patsnap Eureka
  • Unparalleled Data Quality
  • Higher Quality Content
  • 60% Fewer Hallucinations
Social media
Patsnap Eureka Blog
Learn More