Transverse clamping mechanism capable of reducing BL foreign matter badness

A clamping mechanism and poor technology, used in metal processing, metal processing equipment, manufacturing tools, etc., can solve the problems of assembly material loss, personnel waste, and problem discovery lag, reducing the amount of foreign matter, reducing hard contact, The effect of improving the foreign body defect rate

Inactive Publication Date: 2020-06-26
陕西科尔智控科技有限公司
View PDF0 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0002] With the development of optoelectronic technology, there are more and more types of optoelectronic products and samples. With the maturity of automation technology, the production line of optoelectronic products has gradually replaced the original manual production line, greatly improving production efficiency, but automated production also has its own advantages. Defects that exist objectively, the most obvious is the lag in finding the problem. For example, the defective phenomenon appears on the backplane, and because it is an automatic production line, it is not until after the assembly of the photoelectric products is completed that it passes through the CCD automatic inspection machine. It can be found, so that there are a large number of heavy industrial products, but as far as the existing technology is concerned, the secondary processing and maintenance of heavy industrial products must be carried out manually, and a large amount of assembly material damage and personnel waste are caused during the heavy industrial process

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Transverse clamping mechanism capable of reducing BL foreign matter badness
  • Transverse clamping mechanism capable of reducing BL foreign matter badness
  • Transverse clamping mechanism capable of reducing BL foreign matter badness

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0030] join figure 1 , the lateral positioning member 200' in the prior art serves as a lateral clamping member through a long condition in order to meet the lateral positioning of backboards of different sizes, and the outer wall of the backboard is not smooth, and when clamping, the backboard There is also a small amount of longitudinal movement of the plate, which will cause displacement between the back plate and the clamping parts, which will cause the back plate and / or the clamping parts to be worn and produce foreign objects; due to the movement of the back plate, assembly line rollers, and machine During the movement of the arm, the airflow in the machine will be disturbed for a short time, causing the generated foreign objects to fall onto the backplane, or be placed on the surface of the film material on the backplane, causing foreign objects to be defective.

[0031] In order to solve the problem that the frictional force between the existing backplane lateral posit...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention relates to a transverse clamping mechanism capable of reducing BL foreign matter badness. The transverse clamping mechanism comprises a transverse locating assembly and a bottom supporting assembly. The transverse locating assembly comprises a base and a locating part, and the base is fixedly connected with the output end of a telescopic air cylinder. Multiple mounting holes are evenly distributed on the base. The locating part comprises at least two locating rods and clamping parts arranged at the tops of the locating rods, and mounting blocks cooperating with the mounting holesare arranged at the bottom ends of the locating rods. The clamping parts are rotationally connected with the locating rods. The bottom supporting assembly comprises a supporting plate and multiple fins. At least one jacking air cylinder is arranged at the bottom end of the supporting plate. The fins are vertically fixed to the supporting plate and distributed in the longitudinal direction of an assembly line, and multiple steel balls are evenly distributed at the tops of the fins. The transverse locating parts and a back plate are in rolling contact, and therefore hard contact of the transverse locating parts and protrusions on the side wall of the back plate is greatly reduced, the quantity of foreign matter generated by relative friction is reduced, and the reject ratio of foreign matter generated in the assembly process is improved.

Description

technical field [0001] The invention belongs to the technical field of photoelectric product production, and in particular relates to a lateral clamping mechanism for reducing BL foreign matter defects. Background technique [0002] With the development of optoelectronic technology, there are more and more types of optoelectronic products and samples. With the maturity of automation technology, the production line of optoelectronic products has gradually replaced the original manual production line, greatly improving production efficiency, but automated production also has its own advantages. Defects that exist objectively, the most obvious is the lag in finding the problem. For example, the defective phenomenon appears on the backplane, and because it is an automatic production line, it is not until after the assembly of the photoelectric products is completed that it passes through the CCD automatic inspection machine. It can be found, so that there are a large number of h...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): B23P19/00
CPCB23P19/00
Inventor 王余杰杨明川
Owner 陕西科尔智控科技有限公司
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products