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A Fourier stack imaging system based on telecentric scanning lens

A technology of Fourier stacking and scanning lenses, which is applied in microscopes, instruments, optics, etc., can solve the problems of uneven illumination intensity, small field of view for single reconstruction, and illumination, so as to improve image reconstruction efficiency and improve reconstruction Efficiency, the effect of improving the efficiency of high-resolution image reconstruction

Active Publication Date: 2022-01-11
CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
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Problems solved by technology

[0006] The present invention aims to solve the technical problems of uneven illumination intensity, spherical wave illumination, and small field of view for a single reconstruction in the traditional imaging method, and provides a Fourier stack imaging system based on a telecentric scanning lens

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  • A Fourier stack imaging system based on telecentric scanning lens
  • A Fourier stack imaging system based on telecentric scanning lens
  • A Fourier stack imaging system based on telecentric scanning lens

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Embodiment Construction

[0050] The invention of the invention is:

[0051] Traditional Fourier stacked micro-imaging system figure 1As shown, the system is composed of a first LED array light source 101, a first sample 102, a first micromoscope 103, a first bushole 104, and a first CCD camera 105. The first LED array light source 101 is h and the LED spacing D from the first sample 102. After the first LED array light source 101, after blocking the first sample 102, the first disc mirror 103 is sequentially entered into the first microscope 103, and the first bushole 104 is received by the first CCD camera 105. The point light source of the first LED array light source 101 is in turn light, and the point light source emitting the spherical wave can be approximately planar waves in a small range, whereby the first sample 102 is illuminated by the flat wave in different angles, The spectrum of the material body on the first microscope 103 is translatted to the corresponding different positions, so some spa...

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Abstract

The invention relates to a Fourier stack imaging system based on a telecentric scanning lens, which solves the technical problems of uneven illumination light intensity, spherical wave illumination, and small single-time reconstruction field of view in traditional imaging methods. The Fourier laminated imaging system of the present invention is a new lighting method that adopts a combination of a telecentric scanning lens and an LED array light source. All LED array light sources are placed perpendicular to the optical axis to obtain consistent light irradiation intensity; each LED array point The spherical wave emitted by the light source is converted into a plane wave to irradiate the sample through the telecentric scanning lens. There is no difference in the wave vector of the whole field of view. During reconstruction, the whole field of view can be directly reconstructed, eliminating the need for splicing and fusion of each sub-field of view The process greatly improves the reconstruction efficiency. The imaging system of the present invention can ensure that each LED array light source uniformly irradiates the sample with a plane wave of equal light intensity, so that the field of view of a single reconstruction is increased from the traditional 0.45mm*0.45mm to 3.82mm*3.82mm, which greatly improves the height. High-resolution image reconstruction efficiency makes real-time Fourier stack imaging possible.

Description

Technical field [0001] The present invention relates to a Fourier laminate microscopic imaging technique of a large field reconstruction, and more particularly to a Fourier stacked imaging system based on a telecentric scanning lens, which belongs to the field of calculating optical microscopic imaging. Background technique [0002] In the field of microscopic imaging, important parameters of the microbial imaging system mainly have resolution and field of view, but there is an irregular contradiction between the two, and the existing way to improve the resolution is mostly the numerical aperture of the microscope, but Increasing the problems brought about numerical apertures will be sharply reduced, so how to improve the resolution under the premise of the field of view is the hotspots and difficulties of current research. Currently improved system resolutions typically have synthetic apertures, confocal scanning techniques, light field imaging techniques, and the like. The abov...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G02B21/06G02B21/02G02B21/36
CPCG02B21/06G02B21/02G02B21/367
Inventor 穆全全朱友强李大禹
Owner CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
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