A fully electronically controlled two-dimensional beam scanning device

A beam scanning and scanning device technology, applied in the field of optical phased arrays, can solve the problems of complex control and high power consumption, and achieve the effects of reducing chip power consumption, easing heat dissipation pressure, and reducing workload

Active Publication Date: 2021-02-12
HUAZHONG UNIV OF SCI & TECH
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Problems solved by technology

[0007] The purpose of the present invention is to provide a fully electronically controlled two-dimensional beam scanning device, which solves the problems of complex control and high power consumption in traditional two-dimensional optical phased array systems through hybrid integration

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  • A fully electronically controlled two-dimensional beam scanning device
  • A fully electronically controlled two-dimensional beam scanning device
  • A fully electronically controlled two-dimensional beam scanning device

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Embodiment Construction

[0023] In order to make the object, technical solution and advantages of the present invention clearer, the specific implementation manners of the present invention will be further described in detail below in conjunction with examples. It should be understood that the embodiments described here are only used to explain the present invention, but not to limit the scope of the present invention.

[0024] A fully electronically controlled two-dimensional beam scanning device in one embodiment of the present invention includes a laser, a one-dimensional waveguide phased array 1, a MEMS mirror 2 and a control chip, wherein the laser is used to emit a laser beam. figure 1 and figure 2 It is a schematic structural diagram of a fully electronically controlled two-dimensional beam scanning device in the X-Y direction and X-Z direction according to an embodiment of the present invention. It can be seen from the figure that the one-dimensional waveguide phased array 1 is used to gener...

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Abstract

The present invention proposes a fully electronically controlled two-dimensional beam scanning device, which includes a laser, a one-dimensional waveguide phased array, a cylindrical lens, a MEMS mirror and a control chip; The beam passes through the phased array to generate a one-dimensional first scanning beam. The first scanning beam is shaped by a cylindrical lens, and then reflected to the free space by a MEMS mirror. The MEMS mirror rotates around the axis, and the one-dimensional waveguide phase-controlled Both the array and the MEMS mirror are electrically connected to the control chip, so as to control the second scanning light beam emitted from the MEMS mirror to realize full-space two-dimensional scanning. The two-dimensional beam scanning device provided by the present invention realizes full-space two-dimensional scanning of the laser beam by mixing and integrating one-dimensional phased array and MEMS mirrors. Compared with the traditional two-dimensional phased array system, the advantages of the present invention are: The laser cost is saved, the workload of the control chip is reduced, the power consumption of the chip is reduced, the heat dissipation pressure is relieved, and it is beneficial to the miniaturization and integration of the system.

Description

technical field [0001] The invention belongs to the technical field of optical phased arrays, in particular to a hybrid integrated two-dimensional light beam deflection device. Background technique [0002] Similar to traditional microwave radar using microwave scanning, lidar searches and tracks targets by controlling the deflection of laser beams, and then achieves the purpose of obtaining information such as target distance, azimuth and speed. However, due to its high resolution in the time domain, frequency domain and air domain, coupled with its good concealment and small size, it has rapidly gained wide application and attention in the field of target detection. However, the current traditional mechanical scanning lidar is increasingly unable to meet the requirements of high-performance radar due to its relatively complex system and low mechanical scanning speed caused by inertia. [0003] People began to study microwave phased array technology very early, and the con...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01S17/66G01S7/481
CPCG01S7/4817G01S17/66
Inventor 国伟华谈苏陆巧银
Owner HUAZHONG UNIV OF SCI & TECH
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