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Hall sensor tester for ic tester

A technology of Hall sensor and test device, applied in the direction of measurement device, measurement device shell, conversion sensor output, etc., can solve the problems of lack of ability to test Hall sensor test, low degree of automation, low test efficiency, etc. Avoid fixture positioning errors, ensure stability and accuracy, and facilitate maintenance.

Active Publication Date: 2021-02-05
JIANGSU SEVEN DIMENSIONAL TEST TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] However, the current IC tester does not have the ability to test the Hall sensor test, and the Hall sensor test usually uses manual control of the distance of the magnet to control the magnetic field distribution at the product under test, the degree of automation is not high, and the test efficiency is low

Method used

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  • Hall sensor tester for ic tester

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Embodiment Construction

[0027] The present invention will be described in detail below in conjunction with the accompanying drawings and embodiments.

[0028] A Hall sensor testing device for carrying an IC tester, such as figure 1 As shown, there is a base 2, the base 2 is a rectangular parallelepiped plate, the base 2 is provided with a magnetic field mechanism 1, the effect of the magnetic field mechanism 1 is mainly to generate a constant magnetic field, preferably a Helmholtz coil , that is, the Helmholtz coil is fixed on the base 1 by bolts, and a slide rail 7 is fixedly installed on the base 1. The cross section of the slide rail 7 is set in a T shape, and a sensor detection mechanism is installed on the slide rail 7 .

[0029] The sensor detection mechanism includes a slider 12, the slider 12 is installed on the slide rail 7 and can slide along the slide rail 7, a bracket 11 is installed on the slider 12, the bracket 11 is set perpendicular to the base 2, and the bracket 11 is fixed by The ...

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Abstract

The invention discloses a Hall sensor testing device for carrying an IC tester, relates to a digital circuit test device, and aims to solve the problem that the current IC tester cannot test the Hall sensor. The Hall sensor testing device of the IC tester includes a base on which a magnetic field mechanism for generating a fixed magnetic field is installed, and the base is also provided with a sensor detection mechanism for placing the product to be tested, and the sensor detects The mechanism is connected with a driving device for driving the product to be tested into and out of the magnetic field mechanism, and the magnetic field mechanism, the sensor detection mechanism and the driving device are all provided with coil connectors for connecting to the IC tester. The Hall sensor testing device for carrying an IC tester of the present invention can be carried on the IC tester to detect the Hall sensor and realize related tests.

Description

technical field [0001] The present invention relates to a digital circuit testing device, more specifically, it relates to a Hall sensor testing device for carrying an IC tester. Background technique [0002] With the rapid development of the integrated circuit industry, there are more and more types of integrated circuits, and digital integrated circuits occupy a large share of them. Digital integrated circuits have many functions and vary in speed. With a solid foundation, a large number of chips are produced. Since chips may fail during the process of design, manufacture and packaging, they need to be tested. Digital integrated circuit testing includes functional testing, DC parameter testing and AC parameter testing. A traditional digital integrated circuit tester includes a measurement vector memory, a read test vector module, a format code module, an input level conversion module, a program-controlled power supply module, an output level conversion module, a collection...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/28G01D5/14G01R1/04
CPCG01D5/142G01R1/0408G01R31/2829G01R31/2851
Inventor 齐和峰赵键陈元钊施明明孔令丰
Owner JIANGSU SEVEN DIMENSIONAL TEST TECH CO LTD