Intelligent testing system and method for secondary power supply circuits

A technology of secondary power supply and testing method, which is applied in the field of intelligent test system of secondary power supply circuit, can solve problems affecting product quality, low efficiency, and unfixable test time, and achieve the effect of improving test accuracy

Active Publication Date: 2020-08-07
BEIJING AEROSPACE TIMES OPTICAL ELECTRONICS TECH
View PDF8 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Due to the large amount of equipment involved in the testing process, manual operation of the equipment and data recording is not only inefficient, but also prone to errors, affecting product quality
[0003]The current secondary power supply circuit test system can realize automatic test and channel switching function, but the resistance characteristic test of the tested product and the test equipment, the tested The safety monitoring of the circuit has not been clearly stated. During the resistance test of the secondary power supply circuit, there is a charging and discharging process in the internal circuit, so the test time cannot be fixed and there is no unified judgment standard for whether the test results are stable; the input voltage of the secondary power supply and The load capacity has a certain range. If the power supply / load is abnormal or the secondary power supply fails during the test, the test safety will be threatened.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Intelligent testing system and method for secondary power supply circuits
  • Intelligent testing system and method for secondary power supply circuits
  • Intelligent testing system and method for secondary power supply circuits

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0043] Taking two products to be tested as an example, the first product to be tested has 1 input channel, 1 output channel, and 1 shell endpoint; the second product to be tested has 1 input channel, 3 output channels, and 1 End point of the shell; explain according to the whole test process, that is, M=2, N=8.

[0044] Such as figure 1 As shown, an intelligent test system for secondary power supply circuit, the test system is used to test 4 channels of 2 products to be tested, each channel has a load, and each load is composed of Q groups of different magnitudes Composed of permission resistors, Q is a positive integer, according to the combination of permission ratios of 1, 2, 2, 5 or 1, 2, 3, 4, the required resistance value is obtained;

[0045] The test system includes industrial computer, test configuration module, test equipment subsystem and state monitoring and alarm subsystem;

[0046] The test equipment subsystem includes thermostat, input power supply, matrix swi...

Embodiment 2

[0073] Taking two products to be tested as an example, the first product to be tested has 1 input channel, 1 output channel, and 1 shell endpoint; the second product to be tested has 1 input channel, 3 output channels, and 1 The end point of the shell; it is explained according to the whole test process, that is, M=2, N=8, and the specific steps are as follows:

[0074] (1) Connect the product under test, turn on the industrial computer, enter the test configuration module, and set the test equipment configuration parameter A and test configuration parameter B according to the test item.

[0075] The corresponding parameters of each test item in the test configuration module and test equipment, indicators and alarms are shown in the following tables.

[0076] Resistance test configuration item table

[0077]

[0078] Voltage test configuration item table

[0079]

[0080]

[0081] Waveform test configuration item table

[0082]

[0083] Temperature Screening Tes...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention relates to an intelligent testing system and method for secondary power supply circuits, belongs to the technical field of secondary power supply circuit testing, and is used for automatically testing a plurality of secondary power supply circuits at the same time. The testing system realizes the real-time monitoring, recording and diagnosis of a device operation state, acquires theoutput state information of an incubator, a power supply and a load in real time, displays, updates and stores the information in real time for analyzing and tracing the influence of the device outputstate on a product performance index, and performs closed-loop control on the device; meanwhile, the testing system compares the device state information with an abnormal mode, thereby achieving therecognition, alarm and processing of an device operation fault in the testing process, and achieving the protection to a product and the device.

Description

technical field [0001] The invention relates to an intelligent testing system and method for a secondary power supply circuit, which belongs to the technical field of secondary power supply circuit testing and is used for simultaneous automatic testing of multiple secondary power supply circuits. Background technique [0002] The secondary power circuit test system is a necessary tool for the adjustment and testing of the secondary power circuit. The test of the secondary power supply circuit generally uses equipment such as a thermostat, power supply, load, multimeter, and oscilloscope to conduct a resistance test and output voltage test on the secondary power supply circuit under full temperature conditions. During the test, the test equipment needs to be controlled. , so that it meets the test process requirements. Due to the large amount of equipment involved in the testing process, it is not only inefficient to manually operate the equipment and record data, but also p...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/40
CPCG01R31/40
Inventor 高祖昊王效昆周锋宁红鑫陶钧侯煜柱高玉峰余杨杜江
Owner BEIJING AEROSPACE TIMES OPTICAL ELECTRONICS TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap