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High-temperature pulse dynamic strain calibration device

A technology of dynamic strain and calibration device, applied in measuring devices, instruments, scientific instruments, etc., can solve the problem that dynamic strain measurement cannot be calibrated dynamically, and achieve the effect of solving the slow heating speed

Active Publication Date: 2020-08-18
BEIJING CHANGCHENG INST OF METROLOGY & MEASUREMENT AVIATION IND CORP OF CHINA
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  • Abstract
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  • Claims
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Problems solved by technology

[0004] In order to solve the problem of traceability of dynamic strain gauges and the impossibility of dynamic strain calibration in high temperature environment, the object of the present invention is to provide a high temperature pulse dynamic strain calibration device, which can target strain range ( 300~2000)με, pulse strain of duration (50~100)μs, realize high temperature dynamic strain calibration

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Embodiment 1

[0035] Such as figure 1 , 2 As shown, a high-temperature pulse dynamic strain calibration device disclosed in this embodiment is composed of a dynamic strain excitation system, a high-temperature environment test system, a calibrated strain measurement system, a laser measurement system and a base bracket.

[0036] The dynamic strain excitation system includes a high-pressure gas chamber 1 , an elastic body 2 , a gas pipe 3 , an anvil body 4 , an incident rod 6 , and a transmission rod 15 .

[0037] The high-temperature environment test system includes a high-temperature heating box 10 , a high-temperature strain gauge 12 , a sample 11 , and a coaxial casing 13 .

[0038] The strain measuring system to be calibrated includes a dynamic strain measuring instrument 7 , a high-speed data acquisition system 8 , an analysis system 9 , strain gauges 12 , and strain gauges 14 .

[0039] The laser measurement system includes a lateral laser velocimeter 5 , an axial laser velocimeter ...

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Abstract

The invention discloses a high-temperature pulse dynamic strain calibration device, and belongs to the technical field of strain measurement and testing. The device is mainly composed of a dynamic strain excitation system, a high-temperature environment test system, a calibrated strain measurement system, a laser measurement system and a base support. The projectile body accelerated by the pushingof the compressed gas impacts the incident rod at a high speed to generate the pulse strain as a dynamic strain excitation source, that is, the pulse strain is generated based on a double-Hopkinson separation rod impact mode, so that the pulse strain within a large range and lasting time can be realized. According to the invention, a strain value measured by the laser Doppler measurement system is used as a standard value, and a high-temperature environment test system is combined to adopt a local semi-closed heating scheme, so that strain dynamic calibration at a high temperature is realized. According to the invention, strain measurement calibration is expanded from static characteristics to dynamic characteristics, and strain dynamic calibration in normal-temperature and high-temperature environments can be realized at the same time.

Description

technical field [0001] The invention relates to a high-temperature pulse dynamic strain calibration device, which belongs to the technical field of strain measurement and testing equipment. Background technique [0002] Strain refers to the deformation behavior of solids and structures under loads such as force, moment, and pressure, as well as the deformation behavior of thermal expansion and contraction caused by environmental changes such as temperature. The strain is a physical quantity to quantitatively measure the magnitude of such strain. For strain measurement, people have various principles and methods, from classic resistive strain measurement, capacitive strain measurement, inductive strain measurement, magnetostrictive strain measurement, to semiconductor strain measurement, suspension wire strain measurement , Fiber Bragg Grating strain measurement, etc., there are many principles and methods. [0003] Due to the difficulty of realizing and measuring dynamic s...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N3/62G01N3/307
CPCG01N3/62G01N3/307G01N2203/001G01N2203/0044G01N2203/0075
Inventor 孙浩琳梁志国尹肖
Owner BEIJING CHANGCHENG INST OF METROLOGY & MEASUREMENT AVIATION IND CORP OF CHINA
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