Method and system for detecting and recovering memory bit flipping of power secondary equipment

A secondary equipment, detection and recovery technology, applied to the redundancy in the operation for data error detection, error detection/correction, redundancy code for error detection and other directions, which can solve problems such as equipment function or abnormal results.

Active Publication Date: 2020-08-18
NARI TECH CO LTD +1
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0007] In view of the deficiencies in the prior art, the purpose of the present invention is to provide a method and system for detecting and recovering memory bit flips in secondary elec

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  • Method and system for detecting and recovering memory bit flipping of power secondary equipment
  • Method and system for detecting and recovering memory bit flipping of power secondary equipment
  • Method and system for detecting and recovering memory bit flipping of power secondary equipment

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Embodiment Construction

[0079] The present invention will be further described below in conjunction with the drawings. The following embodiments are only used to illustrate the technical solutions of the present invention more clearly, and cannot be used to limit the protection scope of the present invention.

[0080] The program segment data generally has continuous addresses and meets the operating requirements of the ECC error detection and correction algorithm. Therefore, the software ECC error detection and correction algorithm can be used to quickly locate and recover the single bit flip error of the program segment data; at the same time, considering the occurrence of system memory The possibility of multi-bit data errors, in order to improve the error correction capability of the error detection and correction program, a redundant backup recovery mechanism is added on the basis of the ECC error detection and correction, and the high efficiency and redundancy of the integrated ECC error detection ...

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Abstract

The invention discloses a method and a system for detecting and recovering memory bit flipping of power secondary equipment in the technical field of memory error correction, and aims to solve the technical problem of abnormal equipment function or result caused by memory bit flipping of the power secondary equipment in the prior art. The method comprises the following steps that ECC check code calculation is conducted on an application program running area when an application program is loaded according to the preset ECC segment length, and ECC check codes of segment data of the application program when the application program is loaded are obtained; ECC check code calculation is performed on the segment data of the application program when the application program runs according to a preset ECC segment length to obtain an ECC check code of the segment data of the application program when the application program runs; the ECC check code is compared with the ECC check code; and if it isjudged that the segment data of the application program has a single-bit error during running of the application program according to the comparison result, the bit with the error is corrected.

Description

Technical field [0001] The invention relates to a method and system for detecting and restoring the memory bit flip of a power secondary device, and belongs to the technical field of memory error correction. Background technique [0002] The secondary devices of modern power systems are mostly embedded devices, composed of a large number of chips. One of the core components of the memory chip has millions of memory units, and each unit can store "0" or "1", etc. information. Since the memory is used to temporarily store the program and data being executed, once there is a data error inside it, it will affect the normal operation of the program, and can cause the entire system to fail in severe cases, so its reliability and fault tolerance have always been hot issues in the industry. . [0003] The industry has researched semiconductor and memory technology for many years and found that the causes of memory errors are mainly divided into hard errors and soft errors. Among them, h...

Claims

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Application Information

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IPC IPC(8): G06F11/10G06F11/14G06F11/30G06F11/07
CPCG06F11/1044G06F11/3034G06F11/1469G06F11/0793G06F11/1004
Inventor 周华良刘拯郑玉平李友军张吉邹志扬张连生张成彬朱彬彬戴欣欣郑奕
Owner NARI TECH CO LTD
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