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High-reliability electronic product reliability verification method

A technology of electronic products and verification methods, applied in the direction of electrical digital data processing, special data processing applications, instruments, etc., can solve problems such as no historical data

Active Publication Date: 2020-08-18
CHINA AERO POLYTECH ESTAB
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

If the MTBF requirement value of the product is 20,000 hours, the test time is at least 24,000 hours, which takes about 3 years, so the reliability verification of high-reliability electronic products has become one of the bottlenecks restricting the development
At the same time, due to the use of new materials, new devices, new processes, and new design techniques and methods in the development process of the new generation of equipment, there is no historical data available, which makes the current reliability evaluation methods unable to effectively solve the reliability evaluation problems of high-reliability products

Method used

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  • High-reliability electronic product reliability verification method

Examples

Experimental program
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Effect test

Embodiment 1

[0142] A certain product has completed 1000 reliability simulation tests during the development process, and obtained the working time t before the first failure of 1000 products 1 ,t 2 ,…,t 1000 . During the reliability enhancement test of the product, there were 2 responsible faults and 1 non-responsible fault. One fault occurred in the low temperature step stress test, and the fault conditions are shown in Table 8; 2 faults occurred during the comprehensive environmental test, and the fault conditions were shown in Table 9; the high temperature step stress test, vibration stress test and rapid temperature change test did not error occured.

[0143] The product has completed 1,000 hours of reliability testing during the development process, and no failure has occurred during the period; 1,500 hours of reliability identification test has been carried out with the system, and no failure has occurred during the period;

[0144] There was no failure during the field trial, a...

Embodiment 2

[0227] A certain product has completed 1000 reliability simulation tests during the development process, and obtained the working time t before the first failure of 1000 products 1 ,t 2 ,…,t 1000 . The product did not fail during the reliability enhancement test. The product has completed a 300-hour reliability test during the development process, during which 3 faults occurred. The faults occurred for 11 hours, 48 ​​hours and 176 hours respectively; 1500 hours of reliability identification tests were carried out with the system. One failure occurred 313 hours after the test; the field trial time was two failures during the field trial, and the failure time was 296 hours and 5274 hours after the field trial began; these six failures were taken Instant correction. The reliability requirement value of the product is 5000 hours. According to the data of the development and trial process, it is verified whether the reliability of the product meets the requirements.

[0228] T...

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Abstract

The invention provides a high-reliability electronic product reliability verification method, wherein the method comprises the steps of firstly selecting a data source for reliability verification according to the contribution of data to the reliability of a product, and dividing the data source into three types according to the characteristics of the data source; fusing reliability data in a third-class data source of the product through a data fusion technology based on a geometric process; establishing a reliability evaluation model by utilizing an evidence theory; the reliability enhancement test qualitative information utilization technology is broken through, efficient fusion of different information source data is achieved, the product reliability verification time and test profiledetermination method and the qualification criterion that the product reliability meets the requirement are further provided, and the high-reliability product reliability verification method is formed. According to the method, the difficulties that the development progress requirement is not met and the test cost is high due to long test time when reliability verification is carried out based on GJB899 at present are solved; the reliability work bottleneck of a high-reliability electronic product is dredged; and a technical support is provided for reliability verification of the high-reliability product.

Description

technical field [0001] The invention belongs to the technical field of quality and reliability, and in particular relates to a reliability verification method for high-reliability electronic products. Background technique [0002] The high reliability requirements of the new generation of equipment have led to the problems of long test time and high test expenses for product reliability qualification tests. At present, the reliability verification of electronic products is based on GJB899 "Reliability Appraisal and Acceptance Test". The test time required by the scheme with the shortest test time in the reliability verification scheme given by GJB899 is also the mean time between failures of its reliability requirement value ( MTBF) 1.2 times. If the MTBF requirement of the product is 20,000 hours and the test time is at least 24,000 hours, it will take about 3 years. Therefore, the reliability verification of high-reliability electronic products has become one of the bottl...

Claims

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Application Information

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IPC IPC(8): G06F30/20G06F119/02
CPCG06F30/20G06F2119/02
Inventor 武月琴侯晨光汪启华闫鑫刘宏琴田蔚韩西龙
Owner CHINA AERO POLYTECH ESTAB
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