Test method for high frequency leadless ceramic enclosures with a pitch of 0.5mm
A technology of ceramic shell and test method, which is applied in semiconductor/solid-state device testing/measurement, semiconductor/solid-state device components, semiconductor devices, etc., can solve the problems of deterioration of microwave performance, low impedance of side hollow holes, etc., and achieves good grounding, Good impedance matching, the effect of suppressing resonance
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[0039] In order to make the technical problems, technical solutions and beneficial effects to be solved by the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.
[0040] Please also refer to Figure 1 to Figure 5 , the high-frequency leadless ceramic housing with a pitch of 0.5mm provided by the present invention is now described. The 0.5mm pitch high-frequency leadless ceramic housing includes a housing 1, the outer surface of the housing 1 is provided with a metallized hollow hole, and the back of the housing 1 is provided with a grounding pad 6 and a radio frequency pad 7. The front of the housing 1 is provided with a sealing area 5, the metallized hollow hole has a diameter of 0.2 mm, and the metallized hollow hole incl...
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