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Three-dimensional memory and its manufacturing method

A manufacturing method and memory technology, which are applied to semiconductor devices, electrical solid-state devices, electrical components, etc., can solve the problems of large substrate stress and difficult bonding of peripheral circuits, so as to alleviate the increase in substrate stress and facilitate the bonding of combined effect

Active Publication Date: 2021-03-19
YANGTZE MEMORY TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0006] The main purpose of the present invention is to provide a three-dimensional memory and its manufacturing method to solve the problem of difficulty in bonding with peripheral circuits caused by the high stress on the substrate of the three-dimensional memory with the memory array in the prior art

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  • Three-dimensional memory and its manufacturing method

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Embodiment Construction

[0034] It should be noted that, in the case of no conflict, the embodiments of the present invention and the features in the embodiments can be combined with each other. The present invention will be described in detail below with reference to the accompanying drawings and examples.

[0035] In order to enable those skilled in the art to better understand the solutions of the present invention, the following will clearly and completely describe the technical solutions in the embodiments of the present invention in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only It is an embodiment of a part of the present invention, but not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative efforts shall fall within the protection scope of the present invention.

[0036] It should be noted that the terms "first" and "...

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Abstract

The invention provides a three-dimensional memory and a manufacturing method thereof. The manufacturing method includes the following steps: S1, providing a first substrate with a gate stack structure on its surface, the gate stack structure includes alternate gate structures and isolation layers along a direction away from the first substrate, and the gate stack structure has penetrating through the channel via hole and the common source trench of the first substrate, the channel via hole is provided with a storage structure; S2, filling the common source trench with amorphous silicon and performing a spike annealing treatment, so that part of Amorphous silicon forms a polysilicon shell layer, and the polysilicon shell layer wraps the remaining amorphous silicon; S3, heat-treats the structure after step S2, and the remaining amorphous silicon forms a polysilicon core layer, and the polysilicon shell layer and the polysilicon core layer form a conductive channel . The above manufacturing method can alleviate the stress increase of the substrate caused by the annealing process in the prior art, so that the substrate will not have warpage, which is beneficial to the subsequent bonding with the CMOS circuit.

Description

technical field [0001] The invention relates to the technical field of semiconductors, in particular to a three-dimensional memory and a manufacturing method thereof. Background technique [0002] With the increasing demand for integration and storage capacity, 3D NAND memory has emerged as the times require. 3D NAND memory greatly saves silicon chip area, reduces manufacturing costs, and increases storage capacity. [0003] In the 3D NAND memory structure, a stacked 3D NAND memory structure is realized by vertically stacking multiple layers of data storage units. However, other circuits such as decoders, page buffers, and latches ( latch), etc. These peripheral circuits are all formed by CMOS devices, and the process of CMOS devices cannot be integrated with 3D NAND devices. In the current process, different processes are used to form the 3D NAND memory array and peripheral circuits, and then the two are bonded together by bonding technology. [0004] However, in the cur...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H01L27/1157H01L27/11582H10B43/35H10B43/27
CPCH10B43/35H10B43/27
Inventor 董明曾凡清
Owner YANGTZE MEMORY TECH CO LTD