999 results about "Page buffers" patented technology

Methods and circuits for page based management of an array of Flash RAM nonvolatile memory devices provide paged base reading and writing and block erasure of a flash storage system. The memory management system includes a management processor, a page buffer, and a logical-to-physical translation table. The management processor is in communication with an array of nonvolatile memory devices within the flash storage system to provide control signals for the programming of selected pages, erasing selected blocks, and reading selected pages of the array of nonvolatile memory devices.

A source block (B0) and the logical page number (“8”) of a write target page are identified from the logical address of the write target page. Data objects (DN8, DN9, . . . , DN12) to be written, which a host stores in a page buffer (2), are written into the data areas (DA) of the pages (Q0, Q1, . . . , Q4) of a destination block (Bn), starting from the top page (Q0) in sequence. The logical page number (“8”) of the write target page is written into the redundant area (RA) of the top page (Q0). The physical page number (“6=8−2”) of the write target page is identified, based on the logical page number (“8”) of the write target page and the page offset (“2”) of the source block (B0). When notified by the host of the end of the sending of the data objects (DN8, . . . , DN12), the data items (D13, . . . , D31, D0, D1, . . . , D7) in the source block (B0) are transferred to the pages (Q5, Q6, . . . , Q31) in the destination block (Bn) via the page buffer (2) sequentially and cyclically, starting from the page (P11) situated cyclically behind the write target page (P6) by the number (“5”) of pages of the data objects (DN8, . . . , DN12).

A flash system has multiple channels of flash memory chips that can be accessed in parallel. Host data is assigned to one of the channels by a multi-channel controller processor and accumulated in a multi-channel page buffer. When a page boundary in the page buffer is reached, the page buffer is written to a target physical block if full, or combined with old data fragments in an Aggregating Flash Block (AFB) when the logical-sector addresses (LSA's) match. Thus small fragments are aggregated using the AFB, reducing erases and wear of flash blocks. The page buffer is copied to the AFB when a STOP command occurs. Each channel has one or more AFB's, which are tracked by an AFB tracking table.

High performance and endurance non-volatile memory (NVM) based storage systems are disclosed. According to one aspect of the present invention, a NVM based storage system comprises at least one intelligent NVM device. Each intelligent NVM device includes a control interface logic and NVM. Logical-to-physical address conversion is performed within the control interface logic, thereby eliminating the need of address conversion in a storage system level controller. In another aspect, a volatile memory buffer together with corresponding volatile memory controller and phase-locked loop circuit is included in a NVM based storage system. The volatile memory buffer is partitioned to two parts: a command queue; and one or more page buffers. The command queue is configured to hold received data transfer commands by the storage protocol interface bridge, while the page buffers are configured to hold data to be transmitted between the host computer and the at least one NVM device.

A writing control system providing high-speed writing to a nonvolatile semiconductor storage device, includes (a) a plurality of memory elements each having: a gate electrode provided on a semiconductor layer with an intervening gate insulating film; a channel region provided beneath the gate electrode; a diffusion region provided on both sides of the channel region, having an opposite polarity to the channel region; and a memory functioning member, provided on both sides of the gate electrode, having a function of holding electric charges, (b) a memory array including a page buffer circuit, and (c) CPU controlling writing to the memory array. The CPU loads a first plane of the page buffer circuit with a first byte of data and writes with the first byte of data stored in the first plane. Further, the CPU writes a second byte of data into the second plane and writes the second byte of data having been stored in the second plane while writing the first byte of data having been stored in the first plane into the memory array.

A writing control system providing high-speed writing to a nonvolatile semiconductor storage device, includes (a) a plurality of memory elements each having: a gate electrode provided on a semiconductor layer with an intervening gate insulating film; a channel region provided beneath the gate electrode; a diffusion region provided on both sides of the channel region, having an opposite polarity to the channel region; and a memory functioning member, provided on both sides of the gate electrode, having a function of holding electric charges, (b) a memory array including a page buffer circuit, and (c) CPU controlling writing to the memory array. The CPU loads a first plane of the page buffer circuit with a first byte of data and writes with the first byte of data stored in the first plane. Further, the CPU writes a second byte of data into the second plane and writes the second byte of data having been stored in the second plane while writing the first byte of data having been stored in the first plane into the memory array.

The disclosure is a NAND flash memory with the function of error checking and correction during a page copy operation. The NAND flash memory is able to prohibit transcription of erroneous bits to a duplicate page from a source page. Embodiments of the inventive flash memory include a correction circuit for correcting bit errors of source data stored in a page buffer, a circuit configured to provide the source data to the correction circuit and to provide correction data to the page buffer, and a copy circuit configured to copy the source data to the page buffer, and to store the correction data in the other page from the page buffer.

A NAND-type flash memory device has a multi-plane structure. Page buffers are divided into even page buffers and odd page buffers and are driven at the same time. Cells connected to even bit lines within one page and cell connected to odd bit lines within one page are programmed, read and copyback programmed at the same time.

A memory system includes a NAND flash memory, a NOR flash memory and a SRAM manufactured on a single chip. Both NAND and NOR memories are manufactured by the same NAND manufacturing process and NAND cells. The three memories share the same address bus, data bus, and pins of the single chip. The address bus is bi-directional for receiving codes, data and addresses and transmitting output. The data bus is also bi-directional for receiving and transmitting data. One external chip enable pin and one external output enable pin are shared by the three memories to reduce the number of pins required for the single chip. Both NAND and NOR memories have dual read page buffers and dual write page buffers for Read-While-Load and Write-While-Program operations to accelerate the read and write operations respectively. A memory-mapped method is used to select different memories, status registers and dual read or write page buffers.

A nonvolatile memory device includes a memory cell array configured to comprise memory cells coupled by bit lines and word lines, a page buffer unit configured to comprise page buffers and flag latches, wherein the page buffers, coupled to one or more of the bit lines, each are configured to comprise a plurality of latches for storing logic operation results for error correction and configured to store data read using a read voltage, and the flag latches each are configured to classify the page buffers into some page buffer groups each having a predetermined number and to store flag information indicating whether an error has occurred in each group, and an error detection code (EDC) checker configured to determine whether an error has occurred in each of the page buffer groups.

A flash system has multiple channels of flash memory chips that can be accessed in parallel. Host data is assigned to one of the channels by a multi-channel controller processor and accumulated in a multi-channel page buffer. When a page boundary in the page buffer is reached, the page buffer is written to a target physical block if full, or combined with old data fragments in an Aggregating Flash Block (AFB) when the logical-sector addresses (LSA's) match. Thus small fragments are aggregated using the AFB, reducing erases and wear of flash blocks. The page buffer is copied to the AFB when a STOP command occurs. Each channel has one or more AFB's, which are tracked by an AFB tracking table.

A method of writing data to a non-volatile memory with minimum units of erase of a block, a page being a unit of programming of a block, may read a page of stored data addressable in a first increment of address from the memory into a page buffer, the page of stored data comprising an allocated data space addressable in a second increment of address, pointed to by an address pointer, and comprising obsolete data. The first increment of address is greater than the second increment of address. A portion of stored data in the page buffer may be updated with the data to form an updated page of data. Storage space for the updated page of data may be allocated. The updated page of data may be written to the allocated storage space. The address pointer may be updated with a location of the allocated storage space.

A pipeline accessing method to a large block memory is described. The large block flash memory has a plurality of pages and each page has a plurality of sectors. The memory device has a controller to control an access operation between a host and a cell array of the large block flash memory with a page buffer. The controller includes at least two buffers, when the host intends to program the memory device. In the method, data sectors are transferred between the host and the large block flash memory by alternatively using the buffers. After transferring N data sectors with respect to one page, a start program command is issued by the controller for programming the data.

A memory may include first and second buffer memories and a memory core. The memory core may include memory blocks each having a plurality of pages and a page buffer for reading data from a selected memory block. A control logic may control the first and second buffer memories and the memory core. The control logic may have a register for storing address and command information of the memory core. The control logic may control the memory core so that data read periods for pages of the selected memory block are carried out according to the stored address and command information. The control logic may control the first and second buffer memories and the memory core so that data in the page buffer may be transferred to the first and / or second buffer memories during the data read periods. The control logic may deactivate an interrupt signal when data in the page buffer is transferred to the first and / or second buffer memory and may activate the interrupt signal when data in the first and / or second buffer memory is transferred to an external storage.

A semiconductor memory device includes a cell array region formed on a substrate, a word line contact region, and a page buffer region coupled to the cell array region through bit lines, wherein at least one of the bit lines has a curved structure toward the word line contact region. According to an embodiment, a misalignment between a cell plug and a contact plug caused by a natural cell plug bending phenomenon may be reduced to improve operational reliability of a semiconductor memory device.

A nonvolatile memory device, memory system and read method are disclosed. The memory device comprises a memory cell array comprising a plurality of memory blocks each having a plurality of memory cells adapted to store N bits, where N is an integer greater than 1, a page buffer configured to perform a read operation adapted to read data from the memory cell array and output read data, an error correction circuit configured to detect and correct an error in read data stored in a memory block K and generate corresponding error information, and a control circuit configured to reduce the number of bits stored in the plurality of memory cells for memory block K from N to J, where J is an integer less than N but greater than zero, in response to the error information.

A flash memory device having at least one bank, where the each bank has an independently configurable page size. Each bank includes at least two memory planes having corresponding page buffers, where any number and combination of the memory planes are selectively accessed at the same time in response to configuration data and address data. The configuration data can be loaded into the memory device upon power up for a static page configuration of the bank, or the configuration data can be received with each command to allow for dynamic page configuration of the bank. By selectively adjusting a page size the memory bank, the block size is correspondingly adjusted.

A semiconductor memory device includes a page buffer circuit and an arrangement of memory elements each including: a gate electrode provided on a semiconductor layer with an intervening gate insulating film; a channel region provided beneath the gate electrode; a diffusion area provided on both sides of the channel region, having an opposite polarity to the channel region; and a memory functioning member provided on both sides of the gate electrodes, having a function of storing electric charge. The page buffer circuit provides a common resource shared between a memory array controller and a user. The page buffer circuit has two planes containing random access memory arrays. The page buffer circuit also includes a mode control section to facilitate access to the planes over a main bus in user mode and access to the planes by the memory array controller in memory control mode.

A page buffer is provided for an electrically programmable memory that includes multiple memory cells forming multiple memory pages. The page buffer includes a register for at least temporarily storing data read from or to be written to the memory cells of a selected memory page. The register includes multiple latches and multiple buffer elements. Each of the latches is coupled to at least one signal line for transferring the data bit that is stored in the latch. Each of the buffer elements decouples an output of a corresponding one of the latches from the signal line, with the buffer element driving the signal line according to the data bit stored in the corresponding latch. Also provided is a method of transferring data from a register to signal lines in an electrically programmable memory.

A nonvolatile memory device and programming method and apparatus therefore are described that include operatively coupled first and second sense amplifiers having first and second data registers or latches, a storage circuit for storing a data of the second amplifier, a pass / fail check circuit for checking the content of the second data register whether a cell of the memory device has been sufficiently programmed and a restore circuit for resetting the second data register for reprogramming the device until sufficiently programmed.

The disclosed is a method of reading a multi-level NAND flash memory cell and a circuit for the same. The read circuit for the NAND flash memory device includes a NAND flash memory cell having multi-level information, a first page buffer for storing an upper-bit, a second page buffer for storing a lower bit, and pass transistor for changing information of the second page buffer according to a variation of the first page buffer. In accordance with the present invention, “00” or “01” information is read out by applying a first voltage to a word line of the cell. “00”, “01”, or “11” information is read out by applying a second voltage to the word line. A latch pass control signal is applied to a pass transistor. Thus, it is possible to read out “00”, “01”, “11”, or “10” information.

The present invention provides a multi-bits non-volatile memory circuit having a cell transistor with non-conductive trap gate which has a cell array capable of reading a plural data simultaneously. The present invention is a non-volatile memory circuit in which a plurality of cell transistors M having a non-conductive trapping gate TG are arranged, comprising: a plurality of source-drain lines SDL, which are connected commonly with the source-drain regions SD1, SD2 of cell transistors adjacent in row direction, wherein these adjacent source-drain lines are set to a floating state F, a read-out voltage application state BL, a reference voltage state OV, a read-out voltage state BL, and a floating state F, and the source-drain lines SDL in the read-out voltage state is caused to function as bit lines, such that a plurality of data are read out simultaneously. The above states are generated by the page buffer P / B connected to the source-drain line. The data read and hold are performed by the page buffer.

A flash memory device including a memory cell array block including a plurality of flash memory cells. A program verify voltage generating unit variably generates a program verify voltage that verifies flash memory cells programming. A wordline level selecting unit transfers the program verify voltage to the flash memory cells. And a page buffer, including a latch, stores flash memory cell data and resets the latch whenever the program verify voltage is lowered.

A portable electronic device includes a processing device, a memory operatively coupled to said processing device, said memory comprising a plurality of blocks, wherein at least one block of the plurality of blocks may be powered independent of other blocks of the plurality of blocks, and a logic circuit operative to dynamically adjust a demand page buffer size within the memory and utilized by the processor, thereby permitting a corresponding adjustment of a number of powered memory blocks within the memory.

A flash memory device comprises an array of memory cells capable of storing different numbers of bits per cell. A page buffer circuit for the flash memory device comprises a plurality of page buffers, each operating during programming, erasing, and reading operations of the memory cells. A control logic unit controls functions of the page buffers in accordance with the number of bits stored in corresponding memory cells.

A non-volatile memory device includes a memory cell array at least one block having a plurality of memory cells, and at least one reference cell with respect to each block, an X decoder and a Y decoder for selecting a memory cell for an operation according to an input address, a page buffer for programming data into a memory cell selected by the X decoder and the Y decoder or reading programmed data, and a controller for controlling the memory cell array, the X decoder, the Y decoder and the page buffers to calculate a change in a threshold voltage of the memory cells and compensate for a changed threshold voltage of a memory cell based on a change in a threshold voltage of the reference cell.

A memory system includes a memory cell array, a bit line switch, first and second page buffers, a column switch, an error correction circuit, and control circuits. The second page buffer can swap data with the first page buffer. The control circuits controls the bit line switch and the first and second page buffers, sequentially reads, page by page, one or more pages from the mth (m is a positive integer) page to the nth (n is an integer greater than m) page of the first block in the memory cell array, controls the error correction circuit to perform error correction calculation by the error correction circuit, controls the first and second data buffers and the bit line switch, and controls to perform write in the second block in the erase state in the memory cell array.