Identification and screening method of seedling-stage low-temperature-resistant maize inbred line

A screening method and low temperature-resistant technology, which can be used in measuring devices, instruments, scientific instruments, etc., and can solve the problems of unfavorable identification results, such as accuracy, insignificant differences, and errors.

Pending Publication Date: 2020-09-18
NORTHEAST AGRICULTURAL UNIVERSITY
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Problems solved by technology

Since the low temperature tolerance of maize inbred lines at the seedling stage is a quantitative genetic trait controlled by multiple genes, the existing screening methods usually select physiological and biochemical indicators or growth performance indicators as a single indicator, which is not conducive to the improvement of the accuracy of identification results; but if Taking multiple physiological and biochemical indicators and growth performance indicators as screening indicators will cause problems such as high detection cost, long

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  • Identification and screening method of seedling-stage low-temperature-resistant maize inbred line
  • Identification and screening method of seedling-stage low-temperature-resistant maize inbred line
  • Identification and screening method of seedling-stage low-temperature-resistant maize inbred line

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[0035] Example 1 A method for identification and screening of low temperature tolerant corn inbred lines at seedling stage

[0036] This example provides a method for identifying and screening low-temperature-tolerant corn inbred lines at seedling stage. Through seedling low-temperature stress tests, 8 maize inbred lines that are mainly used in production in Northeast China were evaluated for low-temperature tolerance at seedling stage. Low temperature resistance of the cross line.

[0037] The corn inbred line seeds were provided by the Corn Research Institute of Northeast Agricultural University. The names and genealogy of test materials are shown in Table 1;

[0038] Table 1 Seeds of 8 maize inbred lines

[0039]

[0040]

[0041] Specific steps are as follows:

[0042] (1) Seed selection: select the neatly growing seeds on the corn cob, remove the head and tail, the seeds are full and consistent in size, a total of 120 seeds; the seeds are divided into 6 groups, 20 seeds in each g...

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Abstract

The invention belongs to the technical field of identification and screening of low-temperature-resistant maize inbred lines, and particularly relates to an identification and screening method of a seedling-stage low-temperature-resistant maize inbred line. The identification and screening method of the low-temperature-resistant maize inbred line comprises the following steps: carrying out low-temperature stress treatment and normal-temperature treatment on maize seedlings to be detected; detecting indexes of the corn seedlings obtained by the two treatment modes; screening out a low-temperature-resistant corn selfing line according to a detection result, wherein the conditions of the low-temperature stress treatment are as follows: culturing is carried out at 6-8 DEG C for 7 days, the indexes are seedling length, chlorophyll content and proline content. According to the method, the optimal treatment condition for low-temperature identification of the maize inbred line in the seedlingstage is determined; the selfing line with strong seedling stage low temperature resistance has good seedling plant form, obvious increase of proline content and less decrease of chlorophyll content under low temperature stress, can reduce the damage of low temperature to the seedling stage growth of plants, provides a powerful guarantee for the growth and development of the seedling stage, and lays a foundation for the large-scale identification and screening of low temperature resistant corn germplasms.

Description

technical field [0001] The invention belongs to the technical field of identification and screening of low-temperature-resistant corn inbred lines, and in particular relates to a method for identification and screening of low-temperature-resistant corn inbred lines at the seedling stage. Background technique [0002] Maize is native to tropical and subtropical regions and requires higher temperatures throughout its growth period. The early stage of maize growth and development is more sensitive to low temperature stress. At this time, encountering low temperature will affect seed germination, delay emergence, reduce emergence rate, inhibit the growth and development of seedlings, roots, stems and leaves, hinder photosynthesis, reduce seedling vigor, and greatly Limiting its cultivation range and yield potential. [0003] Low temperature and chilling injury in early spring is one of the important factors affecting the increase of corn yield, which leads to a large area of ​​...

Claims

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Application Information

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IPC IPC(8): G01N33/00G01N25/00
CPCG01N33/0098G01N25/00
Inventor 周羽张嘉月徐庆御王振华邸宏
Owner NORTHEAST AGRICULTURAL UNIVERSITY
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