Identification and screening method of seedling-stage low-temperature-resistant maize inbred line

Abstract

The invention belongs to the technical field of identification and screening of low-temperature-resistant maize inbred lines, and particularly relates to an identification and screening method of a seedling-stage low-temperature-resistant maize inbred line. The identification and screening method of the low-temperature-resistant maize inbred line comprises the following steps: carrying out low-temperature stress treatment and normal-temperature treatment on maize seedlings to be detected; detecting indexes of the corn seedlings obtained by the two treatment modes; screening out a low-temperature-resistant corn selfing line according to a detection result, wherein the conditions of the low-temperature stress treatment are as follows: culturing is carried out at 6-8 DEG C for 7 days, the indexes are seedling length, chlorophyll content and proline content. According to the method, the optimal treatment condition for low-temperature identification of the maize inbred line in the seedlingstage is determined; the selfing line with strong seedling stage low temperature resistance has good seedling plant form, obvious increase of proline content and less decrease of chlorophyll content under low temperature stress, can reduce the damage of low temperature to the seedling stage growth of plants, provides a powerful guarantee for the growth and development of the seedling stage, and lays a foundation for the large-scale identification and screening of low temperature resistant corn germplasms.

Description

technical field [0001] The invention belongs to the technical field of identification and screening of low-temperature-resistant corn inbred lines, and in particular relates to a method for identification and screening of low-temperature-resistant corn inbred lines at the seedling stage. Background technique [0002] Maize is native to tropical and subtropical regions and requires higher temperatures throughout its growth period. The early stage of maize growth and development is more sensitive to low temperature stress. At this time, encountering low temperature will affect seed germination, delay emergence, reduce emergence rate, inhibit the growth and development of seedlings, roots, stems and leaves, hinder photosynthesis, reduce seedling vigor, and greatly Limiting its cultivation range and yield potential. [0003] Low temperature and chilling injury in early spring is one of the important factors affecting the increase of corn yield, which leads to a large area of ​​...

AI Technical Summary

Problems solved by technology

Since the low temperature tolerance of maize inbred lines at the seedling stage is a quantitative genetic trait controlled by multiple genes, the existing screening methods usually select physiological and biochemical indicators or growth performance indicators as a single indicator, which is not conducive to the improvement of the accuracy of identification results; but if Taking multiple physiological and biochemical indicators and growth performance indicators as screening indicators will cause problems such as high detection cost, long detection time, complicated operation and large errors, and it is difficult to accurately reflect the strong low temperature resistance of corn seedlings. Weak; in addition, the existing technology also uses the ratio of the measured values ​​of some traits at low temperature and normal temperature as an index, but because the difference between the relative values ​​is not significant enough in most cases, it is also difficult to accurately evaluate the low temperature tolerance characteristics of maize inbred lines at the seedling stage

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