High-frequency multiple harmonic impedance synthesis testing device based on duplexer

Abstract

A high-frequency multiple harmonic impedance synthesis testing device based on a duplexer comprises a vector network analyzer, a radio frequency probe, a signal source, a direct-current power supply,a driving amplifier, a coupler, a bias device, an attenuator, a connecting piece and the duplexer. Two ends of the direct-current power supply are respectively connected with the bias device, the biasdevice is connected with the radio frequency probe, and the coupler is arranged between the bias device and the radio frequency probe. The coupler is connected with the vector network analyzer. The bias device connected with the left radio frequency probe is also connected with a tuner, and the tuner is connected with a signal source. The bias device connected with the right radio frequency probeis also connected with a harmonic active load module. The harmonic active load module comprises a duplexer, a power amplifier and a harmonic signal source. The attenuator is arranged between the coupler and the vector network analyzer. By arranging the low-power-consumption same-direction duplexer, the harmonic load impedance of the to-be-tested device is matched, and the maximum efficiency of the to-be-tested device is remarkably improved compared with that of the to-be-tested device only matched with a fundamental wave impedance point.

Description

technical field [0001] The invention relates to the field of nonlinear testing of radio frequency devices to be tested, in particular to a duplexer-based high-frequency multiple harmonic impedance synthesis testing device and method. Background technique [0002] In recent years, microwave and millimeter wave power devices, including gallium nitride high electron mobility transistor (GaN HEMT) devices, have become a research hotspot in the radio frequency testing industry. Such devices are frequently used in microwave and millimeter wave circuit devices. For this type of power device, in addition to obtaining the characteristic parameters of the device in the linear region with a small signal test device such as a general S-parameter test, a large-signal nonlinear test device that can test the characteristics of the device in the nonlinear region is also crucial. important. [0003] Load pull test is one of the very important non-linear test techniques, which is very import...

AI Technical Summary

Problems solved by technology

[0004] In the load pull test, in addition to the influence of the fundamental response of the power device, the existence of multiple harmonics will also affect the performance of the device under test due to the existence of multiple harmonics, which will seriously affect the performance of the device under test. Inaccurate assessment of device performance

Images