Aerospace software single event upset resistance reliability evaluation method and system
An aerospace software, anti-single particle technology, applied in the aerospace field, can solve the problems of evaluation and reliability testing of software anti-single particle flipping
Pending Publication Date: 2020-10-23
SHANGHAI AEROSPACE COMP TECH INST
View PDF8 Cites 1 Cited by
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
However, due to the lack of a test environment for simulating on-orbit single-event upsets on the ground, it is impossible to test and evaluate the reliability of software against single-event upsets. We can only use empirical static analysis or learn lessons from repeated on-orbit operation anomalies.
Method used
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View moreImage
Smart Image Click on the blue labels to locate them in the text.
Smart ImageViewing Examples
Examples
Experimental program
Comparison scheme
Effect test
Embodiment Construction
[0026] The present invention will be described in detail below in conjunction with specific embodiments. The following examples will help those skilled in the art to further understand the present invention, but do not limit the present invention in any form. It should be noted that those skilled in the art can make several changes and improvements without departing from the concept of the present invention. These all belong to the protection scope of the present invention.
[0027] figure 1 A schematic flow chart of the aerospace software anti-single event upset reliability evaluation method provided by Embodiment 1 of the present invention, as shown in figure 1 As shown, this implementation may include:
[0028] Step S101 , perform data bit flip fault injection on the test platform for the key data when the aerospace software is running.
[0029] Step S102 , recording the performance impact data of the aerospace system when the data bits are flipped.
[0030] Step S103 ...
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More PUM
Login to View More Abstract
The invention provides an aerospace software single event upset resistance reliability evaluation method and system. The method comprises the steps of: performing data bit upset fault injection on keydata during aerospace software operation on a test platform; recording performance influence data of an aerospace system when data bits are upset; and analyzing the performance influence data according to a preset evaluation rule to obtain a single event upset resistance reliability evaluation result of the aerospace software. Therefore, the problem that a space single event upset test environment is difficult to simulate on the ground is solved through a fault injection mode; through the designed evaluation rule and evaluation method, the problem that the software single event upset resistance reliability is difficult to quantize is solved; and therefore, the reliability design defects of software can be found and improved as soon as possible, and the stability of long-term on-orbit operation of the software is improved.
Description
technical field [0001] The invention relates to the field of aerospace technology, in particular to a method and system for evaluating reliability of aerospace software against single event upset. Background technique [0002] The space environment is full of various particles from the universe, including electrons, neutrons, protons, alpha particles, gamma rays, heavy ions, etc. These particles will cause radiation effects on devices, including single event effects, total dose effects and displacement damage effect etc. The single event effect is a radiation effect that causes abnormal changes in the state of the device when a single high-energy charged particle in space passes through the sensitive area of the microelectronic device. Such effects include single event flipping, single event locking, single event burnout, and single event gate breakdown. The devices used in spacecraft design, such as microprocessors without error detection and correction (Error Detection...
Claims
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More Application Information
Patent Timeline
Login to View More Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/36
CPCG06F11/3644G06F11/366
Inventor 朱剑辉洪小骏施雯邱源王佳王磊张富隆
Owner SHANGHAI AEROSPACE COMP TECH INST