Standby function test method and device for processor chip, equipment and medium

Abstract

The invention discloses a standby function test method for a processor chip. The method comprises the steps of obtaining a standby program used for controlling a target processor chip to enter a standby state; after the target processor enters the standby state according to the standby program, sending a startup instruction to the target processor chip through the programmable device, so that thetarget processor chip enters the startup state; and acquiring operation information of the target processor chip in the startup process, and judging whether the standby function of the target processor chip is normal or not according to the operation information. According to the method, the consumption of human resources can be reduced, and the test efficiency can be greatly improved, so that thetest times can be greatly increased, the test coverage is improved, the abnormal problem of the standby function of the target processor chip can be found in time, and the product quality of the target processor chip is guaranteed. The invention further discloses a standby function testing device of the processor chip and equipment and a computer readable storage medium, which all have the abovebeneficial effects.

Description

technical field [0001] The invention relates to the field of processor chips, in particular to a standby function testing method, device, equipment and computer-readable storage medium of a processor chip. Background technique [0002] With the rapid development of information technology, the application of processor chips is becoming more and more extensive. In practical applications, while the processor chip realizes powerful processing functions, the stability and reliability of its standby function is also one of the key factors to measure the performance of the processor chip. Therefore, it is necessary to test the standby function of the processor chip . [0003] In the prior art, the target processor chip is generally controlled to enter the standby state and the power-on state sequentially through the manual operation of technicians, and then the operating information of the target processor chip during the booting process is obtained, so as to use the operating inf...

AI Technical Summary

Problems solved by technology

However, manual operation not only consumes a lot of human resources, but also the efficiency of manual operation is low, and the number of tests that can be realized is small, resulting in insufficient test coverage, and the abnormal situation of the standby function of the target processor chip cannot be found in time, so that the target cannot be guaranteed. Processor chip product quality

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